Architectural stress is the inability of a system design to
respond to new market demands. It is an important yet often
concealed issue in high tech systems. In "From scientific
instrument to industrial machine, " we look at the phenomenon of
architectural stress in embedded systems in the context of a
transmission electron microscope system built by FEI Company.
Traditionally, transmission electron microscopes are manually
operated scientific instruments, but they also have enormous
potential for use in industrial applications. However, this new
market has quite different characteristics. There are strong
demands for cost-effective analysis, accurate and precise
measurements, and ease-of-use. These demands can be translated into
new system qualities, e.g. reliability, predictability and high
throughput, as well as new functions, e.g. automation of electron
microscopic analyses, automated focusing and positioning
functions.
"From scientific instrument to industrial machine" takes a
pragmatic approach to the problem of architectural stress. In
particular, it describes the outcomes of the Condor project, a
joint endeavour by a consortium of industrial and academic
partners. In this collaboration an integrated approach was
essential to successfully combine various scientific results and
show the first steps towards a new direction. System modelling and
prototyping were the key techniques to develop better understanding
and innovative solutions to the problems associated with
architectural stress.
"From scientific instruments to industrial machine" is targeted
mainly at industrial practitioners, in particular system architects
and engineers working on high tech systems. It can therefore be
read without particular knowledge of electron microscope systems or
microscopic applications. The book forms a bridge between academic
and applied science, and high tech industrial practice. By showing
the approaches and solutions developed for the electron microscope,
it is hoped that system designers will gain some insights in how to
deal with architectural stress in similar challenges in the high
tech industry.
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