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Books > Science & Mathematics > Science: general issues > Scientific equipment & techniques, laboratory equipment > Microscopy

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Noncontact Atomic Force Microscopy (Hardcover, 2002 ed.) Loot Price: R5,231
Discovery Miles 52 310
Repayment Terms: R490 pm x 12*
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Noncontact Atomic Force Microscopy (Hardcover, 2002 ed.): S. Morita, Roland Wiesendanger, E Meyer

Noncontact Atomic Force Microscopy (Hardcover, 2002 ed.)

S. Morita, Roland Wiesendanger, E Meyer

Series: NanoScience and Technology

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Loot Price R5,231 Discovery Miles 52 310 | Repayment Terms: R490 pm x 12*

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Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.

General

Imprint: Springer-Verlag
Country of origin: Germany
Series: NanoScience and Technology
Release date: July 2002
First published: 2002
Editors: S. Morita • Roland Wiesendanger • E Meyer
Dimensions: 235 x 155 x 35mm (L x W x T)
Format: Hardcover
Pages: 440
Edition: 2002 ed.
ISBN-13: 978-3-540-43117-6
Categories: Books > Professional & Technical > Technology: general issues > Nanotechnology
Books > Science & Mathematics > Science: general issues > Scientific equipment & techniques, laboratory equipment > Microscopy
Books > Professional & Technical > Technology: general issues > Instruments & instrumentation engineering > General
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LSN: 3-540-43117-9
Barcode: 9783540431176

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