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Nanoscale Phenomena in Ferroelectric Thin Films (Paperback, Softcover reprint of the original 1st ed. 2004) Loot Price: R5,431
Discovery Miles 54 310
Nanoscale Phenomena in Ferroelectric Thin Films (Paperback, Softcover reprint of the original 1st ed. 2004): Seungbum Hong

Nanoscale Phenomena in Ferroelectric Thin Films (Paperback, Softcover reprint of the original 1st ed. 2004)

Seungbum Hong

Series: Multifunctional Thin Film Series

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Loot Price R5,431 Discovery Miles 54 310 | Repayment Terms: R509 pm x 12*

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This book presents the recent advances in the field of nanoscale science and engineering of ferroelectric thin films. It comprises two main parts, i.e. electrical characterization in nanoscale ferroelectric capacitor, and nano domain manipulation and visualization in ferroelectric materials. Well known le'adingexperts both in relevant academia and industry over the world (U.S., Japan, Germany, Switzerland, Korea) were invited to contribute to each chapter. The first part under the title of electrical characterization in nanoscale ferroelectric capacitors starts with Chapter 1, "Testing and characterization of ferroelectric thin film capacitors," written by Dr. I. K. Yoo. The author provides a comprehensive review on basic concepts and terminologies of ferroelectric properties and their testing methods. This chapter also covers reliability issues in FeRAMs that are crucial for commercialization of high density memory products. In Chapter 2, "Size effects in ferroelectric film capacitors: role ofthe film thickness and capacitor size," Dr. I. Stolichnov discusses the size effects both in in-plane and out-of-plane dimensions of the ferroelectric thin film. The author successfully relates the electric performance and domain dynamics with proposed models of charge injection and stress induced phase transition. The author's findings present both a challenging problem and the clue to its solution of reliably predicting the switching properties for ultra-thin ferroelectric capacitors. In Chapter 3, "Ferroelectric thin films for memory applications: nanoscale characterization by scanning force microscopy," Prof. A.

General

Imprint: Springer-Verlag New York
Country of origin: United States
Series: Multifunctional Thin Film Series
Release date: August 2014
First published: 2004
Editors: Seungbum Hong
Dimensions: 235 x 155 x 17mm (L x W x T)
Format: Paperback
Pages: 288
Edition: Softcover reprint of the original 1st ed. 2004
ISBN-13: 978-1-4613-4771-2
Categories: Books > Science & Mathematics > Chemistry > Organic chemistry > Polymer chemistry
Books > Science & Mathematics > Chemistry > Physical chemistry > General
Books > Professional & Technical > Mechanical engineering & materials > Materials science > General
Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Electronic devices & materials > General
LSN: 1-4613-4771-8
Barcode: 9781461347712

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