AFM-Based Observation and Robotic Nano-manipulation (Paperback, 1st ed. 2020)

This book highlights the latest advances in AFM nano-manipulation research in the field of nanotechnology. There are numerous uncertainties in the AFM nano-manipulation environment, such as thermal drift, tip broadening effect, tip positioning errors and manipulation instability. This book proposes a method for estimating tip morphology using a blind modeling algorithm, which is the basis of the analysis of the influence of thermal drift on AFM scanning images, and also explains how the scanning image of AFM is reconstructed with better accuracy. Further, the book describes how the tip positioning errors caused by thermal drift and system nonlinearity can be corrected using the proposed landmark observation method, and also explores the tip path planning method in a complex environment. Lastly, it presents an AFM-based nano-manipulation platform to illustrate the effectiveness of the proposed method using theoretical research, such as tip positioning and virtual nano-hand.

General

Imprint:	Springer Verlag, Singapore
Country of origin:	Singapore
Release date:	August 2021
First published:	2020
Authors:	Shuai Yuan • Lianqing Liu • Zhidong Wang • Ning Xi
Dimensions:	235 x 155mm (L x W)
Format:	Paperback
Pages:	184
Edition:	1st ed. 2020
ISBN-13:	978-981-15-0510-2
Categories:	Books > Professional & Technical > Technology: general issues > Nanotechnology Books > Professional & Technical > Industrial chemistry & manufacturing technologies > Other manufacturing technologies > Precision instruments manufacture > General Books > Professional & Technical > Mechanical engineering & materials > Materials science > Testing of materials > General
LSN:	981-15-0510-1
Barcode:	9789811505102

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