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Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Electronic devices & materials > Semi-conductors & super-conductors

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Advances in Scanning Probe Microscopy (Hardcover, 2000 ed.) Loot Price: R2,923

Discovery Miles 29 230

Repayment Terms: R274 pm x 12*

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Advances in Scanning Probe Microscopy (Hardcover, 2000 ed.): T. Sakurai, Y. Watanabe

Advances in Scanning Probe Microscopy (Hardcover, 2000 ed.)

T. Sakurai, Y. Watanabe

Series: Advances in Materials Research, 2

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Loot Price R2,923 Discovery Miles 29 230 | Repayment Terms: R274 pm x 12*

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This book covers several of the most important topics of current interest at the forefront of scanning probe microscopy. These include a realistic theory of atom-resolving atomic force microscopy (AFM), fundamentals of MBE growth of III-V compound semiconductors and atomic manipulation for future single-electron devices.

General

Imprint:	Springer-Verlag
Country of origin:	Germany
Series:	Advances in Materials Research, 2
Release date:	March 2000
First published:	2000
Editors:	T. Sakurai • Y. Watanabe
Dimensions:	235 x 155 x 20mm (L x W x T)
Format:	Hardcover
Pages:	343
Edition:	2000 ed.
ISBN-13:	978-3-540-66718-6
Categories:	Books > Science & Mathematics > Science: general issues > Scientific equipment & techniques, laboratory equipment > Microscopy Books > Professional & Technical > Mechanical engineering & materials > Materials science > General Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Electronic devices & materials > Semi-conductors & super-conductors Promotions
LSN:	3-540-66718-0
Barcode:	9783540667186