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Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Electronic devices & materials > Semi-conductors & super-conductors

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Advances in Scanning Probe Microscopy (Hardcover, 2000 ed.) Loot Price: R3,192
Discovery Miles 31 920
Repayment Terms: R299 pm x 12*
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Advances in Scanning Probe Microscopy (Hardcover, 2000 ed.): T. Sakurai, Y. Watanabe

Advances in Scanning Probe Microscopy (Hardcover, 2000 ed.)

T. Sakurai, Y. Watanabe

Series: Advances in Materials Research, 2

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Loot Price R3,192 Discovery Miles 31 920 | Repayment Terms: R299 pm x 12*

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Advances in Scanning Probe Microscopy (Hardcover, 2000 ed.): T. Sakurai, Y. Watanabe
Advances in Scanning Probe Microscopy
R3,192
Against Period Poverty:
Against Period Poverty
R20
Total price: R3,212
Discovery Miles: 32 120
Terms: R301 pm x 12*
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This book covers several of the most important topics of current interest at the forefront of scanning probe microscopy. These include a realistic theory of atom-resolving atomic force microscopy (AFM), fundamentals of MBE growth of III-V compound semiconductors and atomic manipulation for future single-electron devices.

General

Imprint: Springer-Verlag
Country of origin: Germany
Series: Advances in Materials Research, 2
Release date: March 2000
First published: 2000
Editors: T. Sakurai • Y. Watanabe
Dimensions: 235 x 155 x 20mm (L x W x T)
Format: Hardcover
Pages: 343
Edition: 2000 ed.
ISBN-13: 978-3-540-66718-6
Categories: Books > Science & Mathematics > Science: general issues > Scientific equipment & techniques, laboratory equipment > Microscopy
Books > Professional & Technical > Mechanical engineering & materials > Materials science > General
Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Electronic devices & materials > Semi-conductors & super-conductors
LSN: 3-540-66718-0
Barcode: 9783540667186

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