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Books > Reference & Interdisciplinary > Library & information sciences
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Applying the Rasch Model and Structural Equation Modeling to Higher Education - The Technology Satisfaction Model (Hardcover)
Loot Price: R2,977
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Applying the Rasch Model and Structural Equation Modeling to Higher Education - The Technology Satisfaction Model (Hardcover)
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This book introduces the fundamentals of the technology
satisfaction model (TSM), supporting readers in applying the Rasch
model and Structural Equation Modelling (SEM) - a multivariate
technique - to higher education (HE) research. User satisfaction is
traditionally measured along a single dimension. However, the TSM
includes digital technologies for teaching, learning and research
across three dimensions: computer efficacy, perceived ease of use
and perceived usefulness. Establishing relationships among these
factors is a challenge. Although commonly used in psychology to
trace relationships, Rasch and SEM approaches are rarely used in
educational technology or library and information science. This
book, therefore, shows that combining these two analytical tools
offers researchers better options for measurement and
generalization in HE research. This title presents theoretical and
methodological insight of use to researchers in HE.
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