Applying the Rasch Model and Structural Equation Modeling to Higher Education - The Technology Satisfaction Model (Hardcover)

This book introduces the fundamentals of the technology satisfaction model (TSM), supporting readers in applying the Rasch model and Structural Equation Modelling (SEM) - a multivariate technique - to higher education (HE) research. User satisfaction is traditionally measured along a single dimension. However, the TSM includes digital technologies for teaching, learning and research across three dimensions: computer efficacy, perceived ease of use and perceived usefulness. Establishing relationships among these factors is a challenge. Although commonly used in psychology to trace relationships, Rasch and SEM approaches are rarely used in educational technology or library and information science. This book, therefore, shows that combining these two analytical tools offers researchers better options for measurement and generalization in HE research. This title presents theoretical and methodological insight of use to researchers in HE.

General

Imprint:	Taylor & Francis
Country of origin:	United Kingdom
Release date:	June 2023
First published:	2023
Authors:	A.Y.M. Atiquil Islam
Dimensions:	234 x 156mm (L x W)
Format:	Hardcover
Pages:	176
ISBN-13:	978-1-03-247140-2
Categories:	Books > Reference & Interdisciplinary > Library & information sciences > General Books > Social sciences > Education > Educational psychology Books > Science & Mathematics > Mathematics > Probability & statistics Books > Reference & Interdisciplinary > Encyclopaedias & reference works > Reference works > General Books > Social sciences > Psychology > Philosophy & theory of psychology > General Promotions
LSN:	1-03-247140-9
Barcode:	9781032471402

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