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Advances in X-Ray Analysis (Paperback, Softcover reprint of the original 1st ed. 1991) Loot Price: R1,483
Discovery Miles 14 830
Advances in X-Ray Analysis (Paperback, Softcover reprint of the original 1st ed. 1991): C.S. Barrett, M. Amara, Ting C. Huang,...

Advances in X-Ray Analysis (Paperback, Softcover reprint of the original 1st ed. 1991)

C.S. Barrett, M. Amara, Ting C. Huang, Nick Bernard, Dietrich Knorr

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Loot Price R1,483 Discovery Miles 14 830 | Repayment Terms: R139 pm x 12*

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The 39th Annual Denver X-Ray Conference on Applications of X-Ray Analysis was held July 30 -August 3, 1990, at the Sheraton Steamboat Resort and Conference Center, Steamboat Springs, Colorado. The "Denver Conference" is recognized to be a major event in the x-ray analysis field, bringing together scientists and engineers from around the world to discuss the state of the art in x-ray applications as well as indications for future develop ments. In recent years there has been a steady expansion of applications of x-ray analysis to characterize surfaces and thin films. To introduce the audience to one of the exciting and important new developments in x-ray fluorescence, the topic for the Plenary Session of the 1990 Conference was: "Surface and Near-Surface X-Ray Spectroscopy. " The Conference had the privilege of inviting five leading world experts in the field of x-ray spectroscopy to deliver lectures at the Plenary Session. The first two lectures were on total-reflection x-ray fluorescence spectrometry. Professor P. Wobrauschek of Austria reviewed "Recent Developments and Results in Total-Reflection X-Ray Fluorescence. " Trends and applications of the technique were also discussed. Dr. T. Arai of Japan reported on "Surface and Near-Surface Analysis of Silicon Wafers by Total Reflection X-Ray Fluorescence. " He emphasized the importance of using proper x-ray optics to achieve high signal-to-noise ratios. A mathematical model relating the x-ray intensity to the depth of x-ray penetration was also described.

General

Imprint: Springer-Verlag New York
Country of origin: United States
Release date: February 2013
First published: 1991
Editors: C.S. Barrett • M. Amara • Ting C. Huang • Nick Bernard • Dietrich Knorr
Dimensions: 254 x 178 x 39mm (L x W x T)
Format: Paperback
Pages: 743
Edition: Softcover reprint of the original 1st ed. 1991
ISBN-13: 978-1-4613-6667-6
Categories: Books > Professional & Technical > Energy technology & engineering > Electrical engineering > General
Books > Professional & Technical > Mechanical engineering & materials > Materials science > Testing of materials > General
Books > Science & Mathematics > Chemistry > Analytical chemistry > Qualitative analytical chemistry > Chemical spectroscopy, spectrochemistry > General
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LSN: 1-4613-6667-4
Barcode: 9781461366676

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