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Books > Science & Mathematics > Chemistry > Analytical chemistry > Qualitative analytical chemistry > Chemical spectroscopy, spectrochemistry

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Advances in X-Ray Analysis - Volume 38 (Hardcover, 1995 ed.) Loot Price: R8,189
Discovery Miles 81 890
Advances in X-Ray Analysis - Volume 38 (Hardcover, 1995 ed.): D.K. Bowen, John V. Gilfrich, C.C. Goldsmith, Ting C. Huang, Ron...

Advances in X-Ray Analysis - Volume 38 (Hardcover, 1995 ed.)

D.K. Bowen, John V. Gilfrich, C.C. Goldsmith, Ting C. Huang, Ron Jenkins, I. Cev Noyan, Paul K. Predecki, Deane K. Smith

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Loot Price R8,189 Discovery Miles 81 890 | Repayment Terms: R767 pm x 12*

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The 43rd Annual Conference on Applications ofX-ray Analysis was held August 1-5, 1994, at the Sheraton Steamboat Resort & Conference Center in Steamboat Springs, Colorado. The Denver X-Ray Conference has evolved from the 1950's into an international forum for the interaction of scientists, engineers and technologists interested in the use of x-rays in materials characterization. It has not only acted as a venue but has both stimulated and nurtured many of the principal developments in this field over the years. The major changes that have been occurring on the national and international scene as a result of the end of the cold war have dramatic-ally affected the way the materials community does business. The removal of defense priorities and development funds from most new materials initiatives has stimulated the char acterization communities to look to increasing the speed of their methods. This is being accom plished via the development of very fast dynamic characterization procedures which can rapidly and intelligently monitor and optimize the formation of a desired microstructure. The develop ment of intelligent characterization procedures applied in real-time during the manufacturing process can lead to the ability to design desired microstructures. Another potential advantage to this approach is its ability to characterize the actual amount of material which goes into a final product; permitting a rapid transition from R&D to manufacturing by avoiding the prob lems associated with scale-up.

General

Imprint: Kluwer Academic / Plenum Publishers
Country of origin: United States
Release date: September 1995
First published: 1995
Editors: D.K. Bowen • John V. Gilfrich • C.C. Goldsmith • Ting C. Huang • Ron Jenkins • I. Cev Noyan • Paul K. Predecki • Deane K. Smith
Dimensions: 254 x 178 x 51mm (L x W x T)
Format: Hardcover
Pages: 787
Edition: 1995 ed.
ISBN-13: 978-0-306-45045-7
Categories: Books > Science & Mathematics > Chemistry > Analytical chemistry > Qualitative analytical chemistry > Chemical spectroscopy, spectrochemistry > General
LSN: 0-306-45045-3
Barcode: 9780306450457

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