A major barrier to the introduction of ferroelectric devices
into mass markets remains their limited reliability due to fatigue.
The underlying physical and chemical mechanisms of this material
fatigue phenomenon are extremely complex, and the relevant
influences range from single-point defects to macroscopic boundary
conditions. This book summarizes the different aspects of fatigue
in ferroelectrics. It is primarily concerned with bulk material
effects. Mechanical, electrical, and physico-chemical processes are
described; reference data are given for different loading regimes
and boundary conditions; and various fatigue models are compared.
The monograph also demonstrates how the results of acoustic
emission and of microscopy studies reveal the microscopic origins
of fatigue in ferroelectric devices.
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