Surface Microscopy with Low Energy Electrons (Hardcover, 2014 ed.)

This book, written by a pioneer in surface physics and thin film research and the inventor of Low Energy Electron Microscopy (LEEM), Spin-Polarized Low Energy Electron Microscopy (SPLEEM) and Spectroscopic Photo Emission and Low Energy Electron Microscopy (SPELEEM), covers these and other techniques for the imaging of surfaces with low energy (slow) electrons. These techniques include Photoemission Electron Microscopy (PEEM), X-ray Photoemission Electron Microscopy (XPEEM), and their combination with microdiffraction and microspectroscopy, all of which use cathode lenses and slow electrons. Of particular interest are the fundamentals and applications of LEEM, PEEM, and XPEEM because of their widespread use. Numerous illustrations will illuminate the fundamental aspects of the electron optics, the experimental setup, and particularly the application results with these instruments. Surface Microscopy with Low Energy Electrons will give the reader a unified picture of the imaging, diffraction, and spectroscopy methods that are possible using low energy electron microscopes.

General

Imprint:	Springer-Verlag New York
Country of origin:	United States
Release date:	July 2014
First published:	2014
Authors:	Ernst Bauer
Dimensions:	235 x 155 x 24mm (L x W x T)
Format:	Hardcover
Pages:	496
Edition:	2014 ed.
ISBN-13:	978-1-4939-0934-6
Categories:	Books > Professional & Technical > Mechanical engineering & materials > Materials science > General Books > Science & Mathematics > Chemistry > Analytical chemistry > Qualitative analytical chemistry > Chemical spectroscopy, spectrochemistry > General
LSN:	1-4939-0934-7
Barcode:	9781493909346

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