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Books > Science & Mathematics > Physics > States of matter > Condensed matter physics (liquids & solids)

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Oberflachenanalytische Charakterisierung Von Metallischen Verunreinigungen Und Oxiden Auf GAAS (German, Paperback, 1997 ed.) Loot Price: R1,295
Discovery Miles 12 950
Oberflachenanalytische Charakterisierung Von Metallischen Verunreinigungen Und Oxiden Auf GAAS (German, Paperback, 1997 ed.):...

Oberflachenanalytische Charakterisierung Von Metallischen Verunreinigungen Und Oxiden Auf GAAS (German, Paperback, 1997 ed.)

Frank Schroeder-Oeynhausen

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Loot Price R1,295 Discovery Miles 12 950 | Repayment Terms: R121 pm x 12*

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Der Autor entwickelt ein Verfahren zum quantitativen Nachweis von metallischen Spurenelementen, das es moglich macht, Oberflachenbelegungen auf GaAs mit sehr geringen Konzentrationen quantitativ nachzuweisen."

General

Imprint: Deutscher Universitats Verlag
Country of origin: Germany
Release date: September 1997
First published: September 1997
As told to: Frank Schroeder-Oeynhausen
Dimensions: 210 x 148 x 8mm (L x W x T)
Format: Paperback - Trade
Pages: 138
Edition: 1997 ed.
ISBN-13: 978-3-8244-2091-9
Languages: German
Subtitles: German
Categories: Books > Business & Economics > Economics > General
Books > Business & Economics > Business & management > Management & management techniques > General
Books > Science & Mathematics > Physics > States of matter > Condensed matter physics (liquids & solids)
Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Electronic devices & materials > General
LSN: 3-8244-2091-0
Barcode: 9783824420919

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