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Atomic Force Microscopy - Understanding Basic Modes and Advanced Applications (Hardcover, New) Loot Price: R3,961

Discovery Miles 39 610

Repayment Terms: R371 pm x 12*

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Atomic Force Microscopy - Understanding Basic Modes and Advanced Applications (Hardcover, New): G Haugstad

Atomic Force Microscopy - Understanding Basic Modes and Advanced Applications (Hardcover, New)

G Haugstad

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Loot Price R3,961 Discovery Miles 39 610 | Repayment Terms: R371 pm x 12*

Expected to ship within 10 - 15 working days

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This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration, physical origin of artifacts, and signal/noise limitations. Coverage spans imaging, materials property characterization, in-liquid interfacial analysis, tribology, and electromagnetic interactions.

"Supplementary material for this book can be found by entering ISBN 9780470638828 on booksupport.wiley.com"

General

Imprint:	John Wiley & Sons
Country of origin:	United States
Release date:	September 2012
First published:	2012
Authors:	G Haugstad
Dimensions:	243 x 155 x 32mm (L x W x T)
Format:	Hardcover
Pages:	496
Edition:	New
ISBN-13:	978-0-470-63882-8
Categories:	Books > Professional & Technical > Technology: general issues > Nanotechnology Books > Professional & Technical > Mechanical engineering & materials > General Books > Science & Mathematics > Science: general issues > Scientific equipment & techniques, laboratory equipment > Microscopy Promotions
LSN:	0-470-63882-6
Barcode:	9780470638828