This second edition is an extended version of the first edition of
Geometrical Charged-Particle Optics. The updated reference
monograph is intended as a guide for researchers and graduate
students who are seeking a comprehensive treatment of the design of
instruments and beam-guiding systems of charged particles and their
propagation in electromagnetic fields. Wave aspects are included in
this edition for explaining electron holography, the Aharanov-Bohm
effect and the resolution of electron microscopes limited by
diffraction. Several methods for calculating the electromagnetic
field are presented and procedures are outlined for calculating the
properties of systems with arbitrarily curved axis. Detailed
methods are presented for designing and optimizing special
components such as aberration correctors, spectrometers, energy
filters monochromators, ion traps, electron mirrors and cathode
lenses. In particular, the optics of rotationally symmetric lenses,
quadrupoles, and systems composed of these elements are discussed
extensively. Beam properties such as emittance, brightness,
transmissivity and the formation of caustics are outlined.
Relativistic motion and spin precession of the electron are treated
in a covariant way by introducing the Lorentz-invariant universal
time and by extending Hamilton's principle from three to four
spatial dimensions where the laboratory time is considered as the
fourth pseudo-spatial coordinate. Using this procedure and
introducing the self action of the electron, its accompanying
electromagnetic field and its radiation field are calculated for
arbitrary motion. In addition, the Stern-Gerlach effect is
revisited for atomic and free electrons.
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