Critical Phenomena at Surfaces and Interfaces - Evanescent X-Ray and Neutron Scattering (Paperback, Softcover reprint of the original 1st ed. 1992)

This book deals with the application of grazing angle x-ray and neutron scattering to the study of surface-induced critical phenomena. With the advent of even more advanced synchrotron radiation sources and new sophisticated instrumentation this novel technique is expected to experience a boom. The comprehensive and detailed presentation of theoretical and experimental aspects of the scattering of evanascent x-ray and neutron waves inside a solid makes this book particularly useful for tutorial courses. Particular emphasis is put on the use of this technique to extract microscopic information (correlation functions) from the real structure of a surface, from buried and magnetic interfaces and from surface roughness.

General

Imprint:	Springer-Verlag
Country of origin:	Germany
Series:	Springer Tracts in Modern Physics, 126
Release date:	October 2013
First published:	1992
Authors:	Helmut Dosch
Dimensions:	235 x 155 x 8mm (L x W x T)
Format:	Paperback
Pages:	149
Edition:	Softcover reprint of the original 1st ed. 1992
ISBN-13:	978-3-662-14975-1
Categories:	Books > Science & Mathematics > Physics > Optics (light) Books > Science & Mathematics > Physics > States of matter > Condensed matter physics (liquids & solids) Books > Science & Mathematics > Chemistry > Physical chemistry > General Books > Professional & Technical > Mechanical engineering & materials > Materials science > Testing of materials > General
LSN:	3-662-14975-3
Barcode:	9783662149751

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