Advances in X-ray Analysis, v. 36 - Proceedings of the Forty-first Annual Conference Held in Colorado Springs, Colorado, August 3-7, 1992 (Hardcover, New)

Mathematical Techniques in XRay Spectrometry: Research in the Quantitative Analysis of Individual Particles by XRay Fluorescence Spectrometry (M. Lankosz et al.). Analysis of Light Elements by XRay Spectrometry: XRFA of Carbon in Steels (F. Weber et al.). XRS Techniques and Instrumentation: Diffraction Peaks in XRay Spectroscopy (R.G.Tissot, R.P. Goehner). OnLine, Industrial, and Other Applications of XRS: Application of XRF in the Aluminum Industry (F.R. Feret). XRay Characterization of Thin Films: Grazing Incidence XRay Characterization of Materials (D.K. Bowen, M. Wormington). WholePattern Fitting, Phase Analysis by Diffraction Methods: Phase Identification Using WholePattern Matching (D.K. Smith et al.). Polymer Applications of XRD. HighTemperature and NonAmbient Applications of XRD. Stress and Strain Determination by Diffraction Methods, Peak Broadening Analysis. XRD Techniques and Instrumentation. 71 additional articles. Index.

General

Imprint:	Kluwer Academic / Plenum Publishers
Country of origin:	Netherlands
Release date:	2001
First published:	August 1993
Volume editors:	John V. Gilfrich • Etc
Dimensions:	230mm (L)
Format:	Hardcover
Pages:	678
Edition:	New
ISBN-13:	978-0-306-44571-2
Categories:	Books > Science & Mathematics > Chemistry > Analytical chemistry > Qualitative analytical chemistry > Chemical spectroscopy, spectrochemistry > General
LSN:	0-306-44571-9
Barcode:	9780306445712

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