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Books > Computing & IT > Applications of computing > Image processing

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Precision Landmark Location for Machine Vision and Photogrammetry - Finding and Achieving the Maximum Possible Accuracy (Hardcover, 2008 ed.) Loot Price: R2,785
Discovery Miles 27 850
Precision Landmark Location for Machine Vision and Photogrammetry - Finding and Achieving the Maximum Possible Accuracy...

Precision Landmark Location for Machine Vision and Photogrammetry - Finding and Achieving the Maximum Possible Accuracy (Hardcover, 2008 ed.)

Jose A Gutierrez, Brian S.R. Armstrong

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Loot Price R2,785 Discovery Miles 27 850 | Repayment Terms: R261 pm x 12*

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The applications of image-based measurement are many and various: image-guided surgery, mobile-robot navigation, component alignment, part inspection and photogrammetry, among others. In all these applications, landmarks are detected and located in images, and measurements made from those locations.Precision Landmark Location for Machine Vision and Photogrammetry addresses the ubiquitous problem of measurement error associated with determining the location of landmarks in images. With a detailed model of the image formation process and landmark location estimation, the Cramer-Rao Lower Bound (CRLB) theory of statistics is applied to determine the least possible measurement uncertainty in a given situation.This monograph provides the reader with: the most complete treatment to date of precision landmark location and the engineering aspects of image capture and processing; detailed theoretical treatment of the CRLB; a software tool for analyzing the potential performance-specific camera/lens/algorithm configurations; two novel algorithms which achieve precision very close to the CRLB; an experimental method for determining the accuracy of landmark location; and, downloadable MATLAB registered] package to assist the reader with applying theoretically-derived results to practical engineering configurations. All of this adds up to a treatment that is at once theoretically sound and eminently practical.Precision Landmark Location for Machine Vision and Photogrammetry will be of great interest to computer scientists and engineers working with and/or studying image processing and measurement. It includes cutting-edge theoretical developments and practical tools so it will appeal to research investigators and system designers.

General

Imprint: Springer London
Country of origin: United Kingdom
Release date: October 2007
First published: 2008
Authors: Jose A Gutierrez • Brian S.R. Armstrong
Dimensions: 235 x 155 x 15mm (L x W x T)
Format: Hardcover
Pages: 162
Edition: 2008 ed.
ISBN-13: 978-1-84628-912-5
Categories: Books > Science & Mathematics > Mathematics > Probability & statistics
Books > Medicine > Other branches of medicine > Medical imaging > Radiology
Books > Earth & environment > Geography > Cartography, geodesy & geographic information systems (GIS) > Geographical information systems (GIS)
Books > Earth & environment > Geography > Cartography, geodesy & geographic information systems (GIS) > Remote sensing
Books > Computing & IT > Applications of computing > Image processing > General
Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Automatic control engineering > General
Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Applied optics > General
LSN: 1-84628-912-2
Barcode: 9781846289125

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