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Books > Science & Mathematics > Science: general issues > Scientific equipment & techniques, laboratory equipment > Microscopy

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Synthetic Polymeric Membranes - Characterization by Atomic Force Microscopy (Hardcover, 2008 ed.) Loot Price: R3,029

Discovery Miles 30 290

Repayment Terms: R284 pm x 12*

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Synthetic Polymeric Membranes - Characterization by Atomic Force Microscopy (Hardcover, 2008 ed.): K.C. Khulbe, C.Y. Feng,...

Synthetic Polymeric Membranes - Characterization by Atomic Force Microscopy (Hardcover, 2008 ed.)

K.C. Khulbe, C.Y. Feng, Takeshi Matsuura

Series: Springer Laboratory

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Loot Price R3,029 Discovery Miles 30 290 | Repayment Terms: R284 pm x 12*

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Researchers in polymeric membranes as well as R&D professionals will find this work an essential addition to the literature. It concentrates on the method recently developed to study the surfaces of synthetic polymeric membranes using an Atomic Force Microscope (AFM), which is fast becoming a very important tool. Each chapter includes information on basic principles, commercial applications, an overview of current research and guidelines for future research.

General

Imprint:	Springer-Verlag
Country of origin:	Germany
Series:	Springer Laboratory
Release date:	December 2007
First published:	2008
Authors:	K.C. Khulbe • C.Y. Feng • Takeshi Matsuura
Dimensions:	235 x 155 x 14mm (L x W x T)
Format:	Hardcover
Pages:	198
Edition:	2008 ed.
ISBN-13:	978-3-540-73993-7
Categories:	Books > Science & Mathematics > Science: general issues > Scientific equipment & techniques, laboratory equipment > Microscopy Books > Professional & Technical > Industrial chemistry & manufacturing technologies > Industrial chemistry > Chemical engineering Promotions
LSN:	3-540-73993-9
Barcode:	9783540739937