Electron Nano-Imaging - Basics of Imaging and Diffraction for TEM and STEM (Hardcover, 1st ed. 2017)

In this book, the bases of imaging and diffraction in transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) are explained in the style of a textbook. The book focuses on the explanation of electron microscopic imaging of TEM and STEM without including in the main text distracting information on basic knowledge of crystal diffraction, wave optics, electron lens, and scattering and diffraction theories, which are explained separately in the appendices. A comprehensive explanation is provided on the basis of Fourier transform theory, and this approach is unique in comparison with other advanced resources on high-resolution electron microscopy. With the present textbook, readers are led to understand the essence of the imaging theories of TEM and STEM without being diverted by other knowledge of electron microscopy. The up-to-date information in this book, particularly on imaging details of STEM and aberration corrections, is valuable worldwide for today's graduate students and professionals just starting their careers.

General

Imprint:	Springer Verlag,Japan
Country of origin:	Japan
Release date:	April 2017
First published:	2017
Authors:	Nobuo Tanaka
Dimensions:	235 x 155 x 27mm (L x W x T)
Format:	Hardcover
Pages:	333
Edition:	1st ed. 2017
ISBN-13:	978-4-431-56500-0
Categories:	Books > Professional & Technical > Technology: general issues > Nanotechnology Books > Professional & Technical > Mechanical engineering & materials > Materials science > Testing of materials > General Books > Science & Mathematics > Chemistry > Analytical chemistry > Qualitative analytical chemistry > Chemical spectroscopy, spectrochemistry > General
LSN:	4-431-56500-0
Barcode:	9784431565000

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