Secondary Ion Mass Spectrometry - An Introduction to Principles and Practices (Hardcover)

Serves as a practical reference for those involved in Secondary Ion Mass Spectrometry (SIMS)- Introduces SIMS along with the highly diverse fields (Chemistry, Physics, Geology and Biology) to it is applied using up to date illustrations- Introduces the accepted fundamentals and pertinent models associated with elemental and molecular sputtering and ion emission- Covers the theory and modes of operation of the instrumentation used in the various forms of SIMS (Static vs Dynamic vs Cluster ion SIMS)- Details how data collection/processing can be carried out, with an emphasis placed on how to recognize and avoid commonly occurring analysis induced distortions- Presented as concisely as believed possible with All sections prepared such that they can be read independently of each other

General

Imprint:	John Wiley & Sons
Country of origin:	United States
Release date:	September 2014
First published:	2014
Authors:	P van der Heide
Dimensions:	243 x 156 x 24mm (L x W x T)
Format:	Hardcover
Pages:	384
ISBN-13:	978-1-118-48048-9
Categories:	Books > Science & Mathematics > Chemistry > Analytical chemistry > Qualitative analytical chemistry > Chemical spectroscopy, spectrochemistry > General Promotions
LSN:	1-118-48048-1
Barcode:	9781118480489

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