Advances in Imaging and Electron Physics, Volume 159 - The Scanning Transmission Electron Microscope (Hardcover, 159th edition)

"Advances in Imaging and Electron Physics" merges two long-running serials--"Advances in Electronics and Electron Physics" and "Advances in Optical and Electron Microscopy." This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. This particular volume presents several timely articles on the scanning transmission electron microscope.
Updated with contributions from leading international scholars and industry experts
Discusses hot topic areas and presents current and future research trends
Provides an invaluable reference and guide for physicists, engineers and mathematicians

General

Imprint:	Academic Press Inc
Country of origin:	United States
Series:	Advances in Imaging and Electron Physics
Release date:	November 2009
First published:	November 2009
Series editors:	Peter W. Hawkes
Dimensions:	229 x 152 x 33mm (L x W x T)
Format:	Hardcover - Cloth over boards
Pages:	320
Edition:	159th edition
ISBN-13:	978-0-12-374986-4
Categories:	Books > Science & Mathematics > Physics > Applied physics & special topics > General Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Applied optics > General Books > Academic & Education > Professional & Technical > Physics
LSN:	0-12-374986-7
Barcode:	9780123749864

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