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Photo-Excited Charge Collection Spectroscopy - Probing the traps in field-effect transistors (Paperback, 2013 ed.) Loot Price: R1,213
Discovery Miles 12 130
You Save: R188 (13%)
Photo-Excited Charge Collection Spectroscopy - Probing the traps in field-effect transistors (Paperback, 2013 ed.): Seongil Im,...

Photo-Excited Charge Collection Spectroscopy - Probing the traps in field-effect transistors (Paperback, 2013 ed.)

Seongil Im, Youn-Gyoung Chang, Jaehoon Kim

Series: SpringerBriefs in Physics

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List price R1,401 Loot Price R1,213 Discovery Miles 12 130 | Repayment Terms: R114 pm x 12* You Save R188 (13%)

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Solid state field-effect devices such as organic and inorganic-channel thin-film transistors (TFTs) have been expected to promote advances in display and sensor electronics. The operational stabilities of such TFTs are thus important, strongly depending on the nature and density of charge traps present at the channel/dielectric interface or in the thin-film channel itself. This book contains how to characterize these traps, starting from the device physics of field-effect transistor (FET). Unlike conventional analysis techniques which are away from well-resolving spectral results, newly-introduced photo-excited charge-collection spectroscopy (PECCS) utilizes the photo-induced threshold voltage response from any type of working transistor devices with organic-, inorganic-, and even nano-channels, directly probing on the traps. So, our technique PECCS has been discussed through more than ten refereed-journal papers in the fields of device electronics, applied physics, applied chemistry, nano-devices and materials science, finally finding a need to be summarized with several chapters in a short book. Device physics and instrumentations of PECCS are well addressed respectively, in the first and second chapters, for the next chapters addressing real applications to organic, oxide, and nanostructured FETs. This book would provide benefits since its contents are not only educational and basic principle-supportive but also applicable and in-house operational.

General

Imprint: Springer
Country of origin: Netherlands
Series: SpringerBriefs in Physics
Release date: May 2013
First published: 2013
Authors: Seongil Im • Youn-Gyoung Chang • Jaehoon Kim
Dimensions: 235 x 155 x 6mm (L x W x T)
Format: Paperback
Pages: 101
Edition: 2013 ed.
ISBN-13: 978-9400763913
Categories: Books > Science & Mathematics > Science: general issues > Scientific standards
Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Circuits & components
Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Applied optics > General
Books > Science & Mathematics > Chemistry > Analytical chemistry > Qualitative analytical chemistry > Chemical spectroscopy, spectrochemistry > General
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LSN: 9400763913
Barcode: 9789400763913

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