This is a guide to the history, principles, manufacture, and applications of integrated circuits (ICs). It covers the elementary physics of semiconductors, and addresses practical issues crucial to the industry, including IC production techniques and facilities, processing, testing and packaging of chips, and reliability problems. Non-mathematical descriptions of complex topics such as silicon ICs can be easily understood by non-specialists.

This book discusses the sensitivity, selectivity, and response times of different sensor materials and their potential application in the design of portable sensor systems for monitoring water pollutants and remediation systems. Beginning with an overview on water pollutants and analytical methods for their detection, the book then moves on to describing the advances in sensor materials research, and the scope for their use in different types of sensors. The book lays emphasis on techniques such as colorimetric, fluorescence, electrochemical, and biological sensing of conventional and emerging pollutants. This book will serve as a handy guide for students, researchers, and professional engineers working in the field of sensor systems for monitoring water pollutants to address various challenges.

HW/SW Co-Design for Heterogeneous Multi-Core Platforms describes the results and outcome of the FP6 project which focuses on the development of an integrated tool chain targeting a heterogeneous multi core platform comprising of a general purpose processor (ARM or powerPC), a DSP (the diopsis) and an FPGA. The tool chain takes existing source code and proposes transformations and mappings such that legacy code can easily be ported to a modern, multi-core platform. Downloadable software will be provided for simulation purposes.

Knowledge exists: you only have to ?nd it VLSI design has come to an important in?ection point with the appearance of large manufacturing variations as semiconductor technology has moved to 45 nm feature sizes and below. If we ignore the random variations in the manufacturing process, simulation-based design essentially becomes useless, since its predictions will be far from the reality of manufactured ICs. On the other hand, using design margins based on some traditional notion of worst-case scenarios can force us to sacri?ce too much in terms of power consumption or manufacturing cost, to the extent of making the design goals even infeasible. We absolutely need to explicitly account for the statistics of this random variability, to have design margins that are accurate so that we can ?nd the optimum balance between yield loss and design cost. This discontinuity in design processes has led many researchers to develop effective methods of statistical design, where the designer can simulate not just the behavior of the nominal design, but the expected statistics of the behavior in manufactured ICs. Memory circuits tend to be the hardest hit by the problem of these random variations because of their high replication count on any single chip, which demands a very high statistical quality from the product. Requirements of 5-6s (0.

This book highlights state-of-the-art in III-nitrides-based light-emitting diodes (LEDs). Motivated by the application prospects in lighting, high-resolution display, and health & medicine, the book systematically introduces the physical fundamentals, epitaxial growth, and device fabrications of III-nitride-based LEDs. Important topics including the structures of chips, device reliability and measurements and the advances in mini and micro LEDs are also discussed. The book is completed with a decade of research experience of the author's team in the design and fabrication of III-nitrides-based LEDs, presenting the novel achievements in the stress control of the large mismatch heterostructures, defect formation and inhibition mechanism of the heteroepitaxial growth, LED epitaxial technologies, and the fabrication of high-efficient flip-chip LEDs. The book comprises of a valuable reference source for researchers and professionals engaged in the research and development of III-nitrides-based LEDs.

The two unique benefits of Concurrent and Comparative Discrete Event Simulation are: speed, which is usually 1000 to 10 000 times faster than conventional discrete event simulation; and methodology, which permits the concurrent/comparative simulation of many thousands of experiments. One idea is that a one-for-many experiment, called the reference, is simulated in its entirety, while all others are simulated only where they differ from the reference. A second idea extends the first one; many one-for-many experiments will be significantly more efficient than only one experiment. These two ideas result in tremendous efficiencies, permitting the concurrent simulation of tens of thousands of experiments. The material in the book covers a vast application area in the scientific and business world. For example, in the design experimentation of nuclear power plant operations, many scenarios can be simulated to derive desirable designs or safe operating procedures. Concurrent fault simulation is already a mature technique in the computer aided design of digital systems. Concurrent/Comparative Simulation (CCS) of several instruction sets for a computer can help a designer in making performance tradeoffs. One of the most powerful future applications for CCS/MDCCS (Concurrent and Comparative Simulation/Multi-Domain Concurrent and Comparative Simulation) will be in the testing and debugging of computer programs.

This book discusses new possibilities and trends in analog circuit design, including applications in communication, measurement and RF systems. The authors combine the main features for circuit design with actual circuit realizations and demonstrate several performance limitations with example circuits.

Adaptive filtering is a topic of immense practical and theoretical value, having applications in areas ranging from digital and wireless communications to biomedical systems. This book enables readers to gain a gradual and solid introduction to the subject, its applications to a variety of topical problems, existing limitations, and extensions of current theories. The book consists of eleven parts?each part containing a series of focused lectures and ending with bibliographic comments, problems, and computer projects with MATLAB solutions.

This is the first comprehensive overview describing the effects of ionizing radiation on MOS devices, and how to design, fabricate, and test integrated circuits intended for use in a radiation environment. It also addresses process-induced radiation effects in the fabrication of high-density circuits, and reviews the history of radiation-hard technology, providing background information for those new to the field. The book includes a comprehensive review of the literature, and an annotated listing of research activities in radiation-hardness research. The volume will be of benefit to semi conductor process development engineers, device and circuit development engineers, device physicists, reliability assurance engineers, project managers and stress analysts.

This book provides a hands-on approach to learning ARM assembly language with the use of a TI microcontroller. The book starts with an introduction to computer architecture and then discusses number systems and digital logic. The text covers ARM Assembly Language, ARM Cortex Architecture and its components, and Hardware Experiments using TILM3S1968. Written for those interested in learning embedded programming using an ARM Microcontroller.

The book systematically introduces the design theory and method of multi-band RF filtering circuits for the modern wireless communication systems or radar systems, which are required to operate at multi-bands. These multi-band filtering RF circuits have drawn more and more attention from the engineers and scientists in the field of RF circuits design. The book proposes the detailed theoretical analysis and abundant experimental data of multi-mode resonators, multi-band bandpass filter with high selectivity, reflectionless multi-band bandpass filter, balanced filter with high suppression, slotline based multi-band balun filter, switchable filtering diplexer based on reused L-shape resonator and miniaturized 55-/95-GHz on-chip dual-band bandpass Filter. The book is intended for undergraduate and graduate students who are interested in filtering circuits design, researchers who are investigating RF & microwave systems, as well as design engineers who are working in the RF & microwave circuits field. Readers can get an in-depth understanding about the multi-band RF filtering circuits design theory and method.

This book introduces readers to electric circuits with variable loads and voltage regulators. It defines invariant relationships for numerous parameters, and proves the concepts characterizing these circuits. Moreover, the book presents the fundamentals of electric circuits and develops circuit theorems, while also familiarizing readers with generalized equivalent circuits and using projective geometry to interpret changes in operating regime parameters. It provides useful expressions for normalized regime parameters and changes in them, as well as convenient formulas for calculating currents. This updated and extended third edition features new chapters on the use of invariant properties in two-port circuits, invariant energy characteristics for limited single-valued two-port circuits, and on testing projective coordinates. Given its novel geometrical approach to real electrical circuits, the book offers a valuable guide for engineers, researchers, and graduate students who are interested in basic electric circuit theory and the regulation and monitoring of power supply systems.

This book provides readers a thorough understanding of the applicability of new-generation silicon-germanium (SiGe) electronic subsystems for electronic warfare and defensive countermeasures in military contexts. It explains in detail the theoretical and technical background, and addresses all aspects of the integration of SiGe as an enabling technology for maritime, land, and airborne / spaceborne electronic warfare, including research, design, development, and implementation. The coverage is supported by mathematical derivations, informative illustrations, practical examples, and case studies. While SiGe technology provides speed, performance, and price advantages in many markets, to date only limited information has been available on its use in electronic warfare systems, especially in developing nations. Addressing that need, this book offers essential engineering guidelines that especially focus on the speed and reliability of current-generation SiGe circuits and highlight emerging innovations that help to ensure the sustainable long-term integration of SiGe into electronic warfare systems.

Testing of Integrated Circuits is important to ensure the production of fault-free chips. However, testing is becoming cumbersome and expensive due to the increasing complexity of these ICs. Technology development has made it possible to produce chips where a complete system, with an enormous transistor count, operating at a high clock frequency, is placed on a single die - SOC (System-on-Chip). The device size miniaturization leads to new fault types, the increasing clock frequencies enforces testing for timing faults, and the increasing transistor count results in a higher number of possible fault sites. Testing must handle all these new challenges in an efficient manner having a global system perspective.

Test design is applied to make a system testable. In a modular core-based environment where blocks of reusable logic, the so called cores, are integrated to a system, test design for each core include: test method selection, test data (stimuli and responses) generation (ATPG), definition of test data storage and partitioning [off-chip as ATE (Automatic Test Equipment) and/or on-chip as BIST (Built-In Self-Test)], wrapper selection and design (IEEE std 1500), TAM (test access mechanism) design, and test scheduling minimizing a cost function whilst considering limitations and constraint. A system test design perspective that takes all the issues above into account is required in order to develop a globally optimized solution.

SOC test design and its optimization is the topic of this book. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation)tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process.

This book contains reviews of recent experimental and theoretical results related to nanomaterials. It focuses on novel functional materials and nanostructures in combination with silicon on insulator (SOI) devices, as well as on the physics of new devices and sensors, nanostructured materials and nano scaled device characterization. Special attention is paid to fabrication and properties of modern low-power, high-performance, miniaturized, portable sensors in a wide range of applications such as telecommunications, radiation control, biomedical instrumentation and chemical analysis. In this book, new approaches exploiting nanotechnologies (such as UTBB FD SOI, Fin FETs, nanowires, graphene or carbon nanotubes on dielectric) to pave a way between "More Moore" and "More than Moore" are considered, in order to create different kinds of sensors and devices which will consume less electrical power, be more portable and totally compatible with modern microelectronics products.

This book highlights selected papers presented at the 10th International Symposium on Embedded Computing and System Design (ISED) 2021. This symposium provides a platform for researchers to share the latest scientific achievements of embedded computing and system design. The book is divided into three broad sections. The first section discusses topics like VLSI and testing, circuits and systems with a focus on emerging technologies. The second section discusses topics like embedded hardware and software systems and novel applications. The final section discusses the state-of-the-art technologies involving IoT, artificial intelligence, green and edge computing that demonstrates the issues currently.

This text discusses sigma- delta- type function circuits, peak detecting function circuits, and peak sampling function circuits in a detailed manner. It further covers all the function circuits designed by using the basic principles of the six building blocks: integrator, the 555 timer integrated circuit, switch, low pass fi lter, peak detector, and sample and hold circuit. It is a useful reference text for senior undergraduate and graduate students in the fi elds of electrical engineering and electronics and communication engineering. This book is accompanied by teaching resources, including a solution manual for the instructors. * Discusses function circuits such as multipliers, dividers, and multiplier cum dividers using the 555 timer. * Explains how function circuits are developed with a simple integrator and the 555 timer. * Extends the applications of 555 timers to perform in function circuits. * Covers important topics such as monostable multivibrator, inverting amplifi er, and peak responding divider. * Presents function circuit conversion such as multiplier to square root and divider to a multiplier. This comprehensive book covers the design of function circuits with the help of 555 timer integrated circuits in a single volume. It further discusses how derived function circuits are implemented with integrator, comparator, low pass fi lter, peak detector, and sample and hold circuits.

This textbook introduces basic and advanced embedded system topics through Arm Cortex M microcontrollers, covering programmable microcontroller usage starting from basic to advanced concepts using the STMicroelectronics Discovery development board. Designed for use in upper-level undergraduate and graduate courses on microcontrollers, microprocessor systems, and embedded systems, the book explores fundamental and advanced topics, real-time operating systems via FreeRTOS and Mbed OS, and then offers a solid grounding in digital signal processing, digital control, and digital image processing concepts - with emphasis placed on the usage of a microcontroller for these advanced topics. The book uses C language, "the" programming language for microcontrollers, C++ language, and MicroPython, which allows Python language usage on a microcontroller. Sample codes and course slides are available for readers and instructors, and a solutions manual is available to instructors. The book will also be an ideal reference for practicing engineers and electronics hobbyists who wish to become familiar with basic and advanced microcontroller concepts.

This book tackles important problems of anomaly detection and health status analysis in complex core router systems, integral to today's Internet Protocol (IP) networks. The techniques described provide the first comprehensive set of data-driven resiliency solutions for core router systems. The authors present an anomaly detector for core router systems using correlation-based time series analysis, which monitors a set of features of a complex core router system. They also describe the design of a changepoint-based anomaly detector such that anomaly detection can be adaptive to changes in the statistical features of data streams. The presentation also includes a symbol-based health status analyzer that first encodes, as a symbol sequence, the long-term complex time series collected from a number of core routers, and then utilizes the symbol sequence for health analysis. Finally, the authors describe an iterative, self-learning procedure for assessing the health status. Enables Accurate Anomaly Detection Using Correlation-Based Time-Series Analysis; Presents the design of a changepoint-based anomaly detector; Includes Hierarchical Symbol-based Health-Status Analysis; Describes an iterative, self-learning procedure for assessing the health status.

Analog Signal Processing brings together in one place important contributions and state-of-the-art research results in this rapidly advancing area. Analog Signal Processing serves as an excellent reference, providing insight into some of the most important issues in the field.

A NATO Advanced Research Workshop (ARW) entitled "Advanced Materials and Technologies for Micro/Nano Devices, Sensors and Actuators" was held in St. Petersburg, Russia, from June 29 to July 2, 2009. The main goal of the Workshop was to examine (at a fundamental level) the very complex scientific issues that pertain to the use of micro- and nano-electromechanical systems (MEMS and NEMS), devices and technologies in next generation commercial and defen- related applications. Micro- and nano-electromechanical systems represent rather broad and diverse technological areas, such as optical systems (micromirrors, waveguides, optical sensors, integrated subsystems), life sciences and lab equipment (micropumps, membranes, lab-on-chip, membranes, microfluidics), sensors (bio-sensors, chemical sensors, gas-phase sensors, sensors integrated with electronics) and RF applications for signal transmission (variable capacitors, tunable filters and antennas, switches, resonators). From a scientific viewpoint, this is a very multi-disciplinary field, including micro- and nano-mechanics (such as stresses in structural materials), electronic effects (e. g. charge transfer), general electrostatics, materials science, surface chemistry, interface science, (nano)tribology, and optics. It is obvious that in order to overcome the problems surrounding next-generation MEMS/NEMS devices and applications it is necessary to tackle them from different angles: theoreticians need to speak with mechanical engineers, and device engineers and modelers to listen to surface physicists. It was therefore one of the main objectives of the workshop to bring together a multidisciplinary team of distinguished researchers.

This edited volume on "Recent Advances in Renewable Energy" presents a selection of refereed papers presented at the 1st International Conference on Electrical Systems and Automation. The book provides rigorous discussions, the state of the art, and recent developments in the field of renewable energy sources supported by examples and case studies, making it an educational tool for relevant undergraduate and graduate courses. The book will be a valuable reference for beginners, researchers, and professionals interested in renewable energy.