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Books > Professional & Technical > Technology: general issues > Nanotechnology

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In-situ Materials Characterization - Across Spatial and Temporal Scales (Hardcover, 2014 ed.) Loot Price: R3,342
Discovery Miles 33 420
You Save: R722 (18%)
In-situ Materials Characterization - Across Spatial and Temporal Scales (Hardcover, 2014 ed.): Alexander Ziegler, Heinz...

In-situ Materials Characterization - Across Spatial and Temporal Scales (Hardcover, 2014 ed.)

Alexander Ziegler, Heinz Graafsma, Xiaofeng Zhang, Joost W.M. Frenken

Series: Springer Series in Materials Science, 193

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List price R4,064 Loot Price R3,342 Discovery Miles 33 420 | Repayment Terms: R313 pm x 12* You Save R722 (18%)

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The behavior of nanoscale materials can change rapidly with time either because the environment changes rapidly or because the influence of the environment propagates quickly across the intrinsically small dimensions of nanoscale materials. Extremely fast time resolution studies using X-rays, electrons and neutrons are of very high interest to many researchers and is a fast-evolving and interesting field for the study of dynamic processes. Therefore, in situ structural characterization and measurements of structure-property relationships covering several decades of length and time scales (from atoms to millimeters and femtoseconds to hours) with high spatial and temporal resolutions are crucially important to understand the synthesis and behavior of multidimensional materials. The techniques described in this book will permit access to the real-time dynamics of materials, surface processes and chemical and biological reactions at various time scales. This book provides an interdisciplinary reference for research using in situ techniques to capture the real-time structural and property responses of materials to surrounding fields using electron, optical and x-ray microscopies (e.g. scanning, transmission and low-energy electron microscopy and scanning probe microscopy) or in the scattering realm with x-ray, neutron and electron diffraction.

General

Imprint: Springer-Verlag
Country of origin: Germany
Series: Springer Series in Materials Science, 193
Release date: April 2014
First published: 2014
Editors: Alexander Ziegler • Heinz Graafsma • Xiaofeng Zhang • Joost W.M. Frenken
Dimensions: 235 x 155 x 19mm (L x W x T)
Format: Hardcover
Pages: 256
Edition: 2014 ed.
ISBN-13: 978-3-642-45151-5
Categories: Books > Professional & Technical > Technology: general issues > Nanotechnology
Books > Professional & Technical > Mechanical engineering & materials > Materials science > Testing of materials > General
Books > Science & Mathematics > Chemistry > Analytical chemistry > Qualitative analytical chemistry > Chemical spectroscopy, spectrochemistry > General
LSN: 3-642-45151-9
Barcode: 9783642451515

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