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Microbeam and Nanobeam Analysis (Paperback, Softcover reprint of the original 1st ed. 1996)
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Microbeam and Nanobeam Analysis (Paperback, Softcover reprint of the original 1st ed. 1996)
Series: Mikrochimica Acta Supplementa, 13
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This supplement of Mikrochimica Acta contains selected papers from
the Fourth Workshop of the European Microanalysis Society (EMAS) on
"Modern Develop- ments and Applications in Microbeam Analysis"
which took place in May 1995 in Saint Malo (France). EMAS was
founded in 1986 by members from almost all european countries in
order to stimulate research, applications and development of all
forms of microbeam methods. One important EMAS activity is the
organisation of biennial workshops for demonstrating the current
status and developing trends of microanalytical techniques. For
this meeting, EMAS chose to highlight the following topics:
Monte-Carlo simula- tions, transport calculations and use of soft
X-rays for electron probe microanalysis (EPMA), dynamic secondary
ion mass spectrometry (SIMS), detection of small quan- tities using
different techniques: synchrotron radiation X-ray fluorescence,
particle in- duced X-ray emission (PIXE), cathodoluminescence
microscopy (CL). Two new kinds of instrumental techniques were also
presented: atomic probe and scanning probe microscopy (STM). The
aim of the conference is to give introductory lectures
corresponding to the topics of the meeting and to have
contributions in the form of po- ster sessions. More than 80
posters were presented. Most of them gave a short oral pre-
sentation. The poster subjects were related to the use of
microanalytical techniques: EPMA with wavelength dispersive
spectrometry (WDS) and energy dispersive spec- trometry (EDS),
Auger electron spectrometry (AES), secondary ion mass spectro-
metry (SIMS), scanning electron microscopy and other topographical
methods like scanning tunneling microscopy (STM) or atomic force
microscopy (AFM).
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