Advances in Imaging and Electron Physics, Volume 155 - Selected Problems of Computational Charged Particle Optics (Hardcover, 155th edition)

"Advances in Imaging and Electron Physics" merges two long-running serials--"Advances in Electronics and Electron Physics" and "Advances in Optical and Electron Microscopy." This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
This monograph summarizes the authors' knowledge and experience acquired over many years in their work on computational charged particle optics. Its main message is that even in this era of powerful computers with a multitude of general-purpose and problem-oriented programs, asymptotic analysis based on perturbation theory remains one of the most effective tools to penetrate deeply into the essence of the problem in question.

General

Imprint:	Academic Press Inc
Country of origin:	United States
Series:	Advances in Imaging and Electron Physics
Release date:	February 2009
First published:	2009
Authors:	Dmitry Greenfield • Mikhael Monastyrskii
Series editors:	Peter W. Hawkes
Dimensions:	229 x 152 x 25mm (L x W x T)
Format:	Hardcover
Pages:	364
Edition:	155th edition
ISBN-13:	978-0-12-374717-4
Categories:	Books > Science & Mathematics > Physics > Applied physics & special topics > General Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Applied optics > General Books > Academic & Education > Professional & Technical > Physics Promotions
LSN:	0-12-374717-1
Barcode:	9780123747174

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