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Scanning Force Microscopy - With Applications to Electric, Magnetic and Atomic Forces (Hardcover, Revised edition) Loot Price: R4,563

Discovery Miles 45 630

Repayment Terms: R428 pm x 12*

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Scanning Force Microscopy - With Applications to Electric, Magnetic and Atomic Forces (Hardcover, Revised edition): Dror Sarid

Scanning Force Microscopy - With Applications to Electric, Magnetic and Atomic Forces (Hardcover, Revised edition)

Dror Sarid

Series: Oxford Series in Optical and Imaging Sciences, 5

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Loot Price R4,563 Discovery Miles 45 630 | Repayment Terms: R428 pm x 12*

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This technology has proved indispensable as a characterization tool with applications in surface physics, chemistry, materials science, bio-science, and data storage media. It has also shown great potential in areas such as the semiconductor and optical quality control industries.

This revised edition updates the earlier such survey of the many rapidly developing subjects concerning the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. It also includes important new research in SFM and a thoroughly revised bibliography. Academic and industrial researchers using SFM or wishing to know more about its potential, will find this book an excellent introduction to this rapidly developing field.

General

Imprint:	Oxford UniversityPress
Country of origin:	United States
Series:	Oxford Series in Optical and Imaging Sciences, 5
Release date:	October 1994
First published:	August 1994
Authors:	Dror Sarid (Professor, Optical Sciences Center)
Dimensions:	242 x 161 x 21mm (L x W x T)
Format:	Hardcover
Pages:	282
Edition:	Revised edition
ISBN-13:	978-0-19-509204-2
Categories:	Books > Science & Mathematics > Science: general issues > Scientific equipment & techniques, laboratory equipment > Microscopy Books > Science & Mathematics > Physics > Applied physics & special topics > General Promotions
LSN:	0-19-509204-X
Barcode:	9780195092042