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Micromachined Thin-Film Sensors for SOI-CMOS Co-Integration (Paperback, Softcover reprint of hardcover 1st ed. 2006) Loot Price: R4,468
Discovery Miles 44 680
Micromachined Thin-Film Sensors for SOI-CMOS Co-Integration (Paperback, Softcover reprint of hardcover 1st ed. 2006): Jean...

Micromachined Thin-Film Sensors for SOI-CMOS Co-Integration (Paperback, Softcover reprint of hardcover 1st ed. 2006)

Jean Laconte, Denis Flandre, Jean-Pierre Raskin

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Loot Price R4,468 Discovery Miles 44 680 | Repayment Terms: R419 pm x 12*

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Co-integration of sensors with their associated electronics on a single silicon chip may provide many significant benefits regarding performance, reliability, miniaturization and process simplicity without significantly increasing the total cost.

Micromachined Thin-Film Sensors for SOI-CMOS Co-integration covers the challenges and interests and demonstrates the successful co-integration of gas-flow sensors on dielectric membrane, with their associated electronics, in CMOS-SOI technology.

We firstly investigate the extraction of residual stress in thin layers and in their stacking and the release, in post-processing, of a 1 um-thick robust and flat dielectric multilayered membrane using Tetramethyl Ammonium Hydroxide (TMAH) silicon micromachining solution. The optimization of its selectivity towards aluminum is largely demonstrated.

The second part focuses on sensors design and characteristics. A novel loop-shape polysilicon microheater is designed and built in a CMOS-SOI standard process. High thermal uniformity, low power consumption and high working temperature are confirmed by extensive measurements. The additional gas flow sensing layers are judiciously chosen and implemented. Measurements in the presence of a nitrogen flow and gas reveal fair sensitivity on a large flow velocity range as well as good response to many gases. Finally, MOS transistors suspended on released dielectric membranes are presented and fully characterized as a concluding demonstrator of the co-integration in SOI technology."

General

Imprint: Springer-Verlag New York
Country of origin: United States
Release date: October 2010
First published: 2006
Authors: Jean Laconte • Denis Flandre • Jean-Pierre Raskin
Dimensions: 240 x 160 x 16mm (L x W x T)
Format: Paperback
Pages: 292
Edition: Softcover reprint of hardcover 1st ed. 2006
ISBN-13: 978-1-4419-3957-9
Categories: Books > Professional & Technical > Technology: general issues > Engineering: general
Books > Science & Mathematics > Physics > Classical mechanics > General
Books > Professional & Technical > Mechanical engineering & materials > Production engineering > General
Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Circuits & components
Books > Science & Mathematics > Chemistry > Analytical chemistry > Qualitative analytical chemistry > Chemical spectroscopy, spectrochemistry > General
LSN: 1-4419-3957-1
Barcode: 9781441939579

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