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Books > Computing & IT > Applications of computing > Image processing
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Epioptics - Linear and Nonlinear Optical Spectroscopy of Surfaces and Interfaces (Paperback, Softcover reprint of the original 1st ed. 1995)
Loot Price: R1,507
Discovery Miles 15 070
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Epioptics - Linear and Nonlinear Optical Spectroscopy of Surfaces and Interfaces (Paperback, Softcover reprint of the original 1st ed. 1995)
Series: ESPRIT Basic Research Series
Expected to ship within 10 - 15 working days
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The study of condensed matter using optical techniques, where
photons act as both probe and signal, has a long history. It is
only recently, however, that the extraction of surface and
interface information, with submonolayer resolution, has been shown
to be possible using optical techniques (where "optical" applies to
electromagnetic radiation in and around the visible region of the
spectrum). This book describes these "epioptic" techniques, which
have now been quite widely applied to semiconductor surfaces and
interfaces. Particular emphasis in the book is placed on recent
studies of submonolayer growth on well-characterised semiconductor
surfaces, many of which have arisen from CEC DGJGII ESPRIT Basic
Research Action No. 3177 "EPIOPTIC," and CEU DGIII ESPRIT Basic
Research Action No. 6878 "EASI." Techniques using other areas of
the spectrum such as the infra-red region (IR spectroscopy, in its
various surface configurations), and the x-ray region (surface
x-ray diffraction, x-ray standing wave), are omitted. The optical
techniques described use simple lamp or small laser sources and are
thus, in principle, easily accessible. Epioptic probes can provide
new information on solid-gas, solid-liquid and liquid-liquid
interfaces. They are particularly suited to growth monitoring.
Emerging process technologies for fabricating submicron and
nanoscale semiconductor devices and novel multilayer materials,
whether based on silicon or compound semiconductors, all require
extremely precise control of growth at surfaces. In situ,
non-destructive, real-time monitoring and characterisation of
surfaces under growth conditions is needed for further progress.
Both atomic scale resolution, and non-destructive characterisation
of buried structures, are required.
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