Atom-Probe Tomography - The Local Electrode Atom Probe (Hardcover, 2014 ed.)

Nanocharacterization by Atom Probe Tomography is a practical guide for researchers interested atomic level characterization of materials with atom probe tomography. Readers will find descriptions of the atom probe instrument and atom probe tomography technique, field ionization, field evaporation and field ion microscopy. The fundamental underlying physics principles are examined, in addition to data reconstruction and visualization, statistical data analysis methods and specimen preparation by electropolishing and FIB-based techniques. A full description of the local electrode atom probe - a new state-of-the-art instrument - is also provided, along with detailed descriptions and limitations of laser pulsing as a method to field evaporate atoms. Valuable coverage of the new ionization theory is also included, which underpins the overall technique.

General

Imprint:	Springer-Verlag New York
Country of origin:	United States
Release date:	August 2014
First published:	2014
Authors:	Michael K Miller • Richard G. Forbes
Dimensions:	235 x 155 x 23mm (L x W x T)
Format:	Hardcover
Pages:	423
Edition:	2014 ed.
ISBN-13:	978-1-4899-7429-7
Categories:	Books > Professional & Technical > Technology: general issues > Nanotechnology Books > Professional & Technical > Mechanical engineering & materials > Materials science > Testing of materials > General Books > Science & Mathematics > Chemistry > Analytical chemistry > Qualitative analytical chemistry > Chemical spectroscopy, spectrochemistry > General
LSN:	1-4899-7429-6
Barcode:	9781489974297

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