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Books > Science & Mathematics > Chemistry > Analytical chemistry > Qualitative analytical chemistry > Chemical spectroscopy, spectrochemistry

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Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon (Paperback, Softcover reprint of the original 1st ed. 2004) Loot Price: R8,194
Discovery Miles 81 940
Repayment Terms: R768 pm x 12*
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Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon (Paperback, Softcover reprint of the original 1st ed....

Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon (Paperback, Softcover reprint of the original 1st ed. 2004)

Peter Pichler

Series: Computational Microelectronics

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Loot Price R8,194 Discovery Miles 81 940 | Repayment Terms: R768 pm x 12*

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This book contains the first comprehensive review of intrinsic point defects, impurities and their complexes in silicon. Besides compiling the structures, energetic properties, identified electrical levels and spectroscopic signatures, and the diffusion behaviour from investigations, it gives a comprehensive introduction into the relevant fundamental concepts.

General

Imprint: Springer-Verlag
Country of origin: Austria
Series: Computational Microelectronics
Release date: November 2012
First published: 2004
Authors: Peter Pichler
Dimensions: 254 x 178 x 30mm (L x W x T)
Format: Paperback
Pages: 554
Edition: Softcover reprint of the original 1st ed. 2004
ISBN-13: 978-3-7091-7204-9
Categories: Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Electronic devices & materials > General
Books > Science & Mathematics > Chemistry > Analytical chemistry > Qualitative analytical chemistry > Chemical spectroscopy, spectrochemistry > General
LSN: 3-7091-7204-7
Barcode: 9783709172049

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