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Advances in Imaging and Electron Physics, Volume 157 - Optics of Charged Particle Analyzers (Hardcover, 157th edition) Loot Price: R7,615

Discovery Miles 76 150

Repayment Terms: R714 pm x 12*

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Advances in Imaging and Electron Physics, Volume 157 - Optics of Charged Particle Analyzers (Hardcover, 157th edition): Peter...

Advances in Imaging and Electron Physics, Volume 157 - Optics of Charged Particle Analyzers (Hardcover, 157th edition)

Peter W. Hawkes

Series: Advances in Imaging and Electron Physics

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Loot Price R7,615 Discovery Miles 76 150 | Repayment Terms: R714 pm x 12*

Expected to ship within 12 - 19 working days

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"Advances in Imaging and Electron Physics " merges two long-running serials--"Advances in Electronics and Electron Physics" and "Advances in Optical and Electron Microscopy."
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
* Contributions from leading international scholars and industry experts
* Discusses hot topic areas and presents current and future research trends
* Invaluable reference and guide for physicists, engineers and mathematicians

General

Imprint:	Academic Press Inc
Country of origin:	United States
Series:	Advances in Imaging and Electron Physics
Release date:	November 2009
First published:	August 2009
Series editors:	Peter W. Hawkes
Dimensions:	229 x 152 x 32mm (L x W x T)
Format:	Hardcover
Pages:	373
Edition:	157th edition
ISBN-13:	978-0-12-374768-6
Categories:	Books > Science & Mathematics > Physics > Applied physics & special topics > General Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Applied optics > General Books > Academic & Education > Professional & Technical > Physics Promotions
LSN:	0-12-374768-6
Barcode:	9780123747686