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Advances in Imaging and Electron Physics, Volume 163 - Optics of Charged Particle Analyzers (Hardcover, 163rd edition) Loot Price: R5,770
Discovery Miles 57 700
Repayment Terms: R541 pm x 12*
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Advances in Imaging and Electron Physics, Volume 163 - Optics of Charged Particle Analyzers (Hardcover, 163rd edition): Peter...

Advances in Imaging and Electron Physics, Volume 163 - Optics of Charged Particle Analyzers (Hardcover, 163rd edition)

Peter W. Hawkes

Series: Advances in Imaging and Electron Physics

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Loot Price R5,770 Discovery Miles 57 700 | Repayment Terms: R541 pm x 12*

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"Advances in Imaging and Electron Physics " merges two long-running serials--"Advances in Electronics and Electron Physics" and "Advances in Optical and Electron Microscopy."
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
* Contributions from leading international scholars and industry experts
* Discusses hot topic areas and presents current and future research trends
* Invaluable reference and guide for physicists, engineers and mathematicians

General

Imprint: Academic Press Inc
Country of origin: United States
Series: Advances in Imaging and Electron Physics
Release date: September 2010
First published: August 2010
Series editors: Peter W. Hawkes
Dimensions: 229 x 152 x 18mm (L x W x T)
Format: Hardcover - Cloth over boards
Pages: 248
Edition: 163rd edition
ISBN-13: 978-0-12-381314-5
Categories: Books > Science & Mathematics > Physics > Applied physics & special topics > General
Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Applied optics > General
Books > Academic & Education > Professional & Technical > Physics
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LSN: 0-12-381314-X
Barcode: 9780123813145

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