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Progress in Nanoscale Characterization and Manipulation (Paperback, Softcover reprint of the original 1st ed. 2018)
Loot Price: R3,333
Discovery Miles 33 330
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Progress in Nanoscale Characterization and Manipulation (Paperback, Softcover reprint of the original 1st ed. 2018)
Series: Springer Tracts in Modern Physics, 272
Expected to ship within 10 - 15 working days
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This book focuses on charged-particle optics and microscopy, as
well as their applications in the materials sciences. Presenting a
range of cutting-edge theoretical and methodological advances in
electron microscopy and microanalysis, and examining their crucial
roles in modern materials research, it offers a unique resource for
all researchers who work in ultramicroscopy and/or materials
research. The book addresses the growing opportunities in this
field and introduces readers to the state of the art in
charged-particle microscopy techniques. It showcases recent
advances in scanning electron microscopy, transmission electron
microscopy and helium ion microscopy, including advanced
spectroscopy, spherical-corrected microscopy, focused-ion imaging
and in-situ microscopy. Covering these and other essential topics,
the book is intended to facilitate the development of microscopy
techniques, inspire young researchers, and make a valuable
contribution to the field.
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