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Books > Science & Mathematics > Science: general issues > Scientific equipment & techniques, laboratory equipment > Microscopy
Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume I concentrates on the newly developed concepts and methods which are making TEM a powerful and indispensible tool in materials science.
Solid state NMR is rapidly emerging as a universally applicable method for the characterization of ordered structures that cannot be studied with solution methods or diffraction techniques. This proceedings -; from a recent international workshop - captures an image of the latest developments and future directions for solid state NMR in biological research, particularly on membrane proteins. Detailed information on how hormones or drugs bind to their membrane receptor targets is needed, e.g. for rational drug design. Higher fields are bringing clear improvements, and the power of solid state NMR techniques for studying amorphous and membrane associated peptides, proteins and complexes is shown by examples of applications at ultra-high fields. Progress in protein expression, experimental design and data analysis are also presented by leaders in these research areas.
Since the pioneering discoveries of Hodgkin, Huxley, and Katz, it has been clear that specific ion conductance pathways underlie electrical act- ity. Over the ensuing 50 years, there has been ever increasing, and occasi- ally explosive, changes in the scope of efforts to understand ion channel behavior. The introduction of patch clamp technology by Erwin Neher and Bert Sakmann about 20 years ago led to the realization of the great variety of novel ion channel species, and the subsequent revolution in cl- ing has revealed an even greater diversity of the underlying molecular entities. Today, advances in the study of ion channel structure and function c- tinue at a high pace, from angstrom resolution imaging of crystallized ch- nels to their genetic manipulations in animals. In this regard, the field is a balanced one that inquires not only what ion channel entities are there, or how they operate, but also where are these molecular electronic switches? However, this balance is not particularly well presented to the general sci- tific audience or to specialists in the field. There are plenty of wonderful and useful books and monographs, as well as conferences and meetings on v- tually every aspect of ion channel structure and function. However, we are unaware that the channel localization theme has been considered in a u- fied forum.
Scanning Tunneling Microscopy and its Application presents a unified view of the rapidly growing field of STM,and its many derivatives. A thorough discussion of the various principles provides the background to tunneling phenomena and leads to the many novel scanning-probe techniques, such as AFM, MFM, BEEM, PSTM, etc. After having examined the available instrumentation and the methods for tip and surface preparations, the monograph provides detailed accounts of STM application to metal and semiconductor surfaces, adsorbates and surface chemistry, biology, and nanofabrication. It examines limitations of the present-day investigations and provides hints about possible further trends. This second edition includes important new developments in the field.
The microanalytical technique of atom probe tomography (APT) permits the spatial coordinates and elemental identities of the individual atoms within a small volume to be determined with near atomic resolution. Therefore, atom probe tomography provides a technique for acquiring atomic resolution three dimensional images of the solute distribution within the microstructures of materials. This monograph is designed to provide researchers and students the necessary information to plan and experimentally conduct an atom probe tomography experiment. The techniques required to visualize and to analyze the resulting three-dimensional data are also described. The monograph is organized into chapters each covering a specific aspect of the technique. The development of this powerful microanalytical technique from the origins offield ion microscopy in 1951, through the first three-dimensional atom probe prototype built in 1986 to today's commercial state-of-the-art three dimensional atom probe is documented in chapter 1. A general introduction to atom probe tomography is also presented in chapter 1. The various methods to fabricate suitable needle-shaped specimens are presented in chapter 2. The procedure to form field ion images of the needle-shaped specimen is described in chapter 3. In addition, the appearance of microstructural features and the information that may be estimated from field ion microscopy are summarized. A brief account of the theoretical basis for processes of field ionization and field evaporation is also included.
This book covers several of the most important topics of current interest at the forefront of scanning probe microscopy. These include a realistic theory of atom-resolving atomic force microscopy (AFM), fundamentals of MBE growth of III-V compound semiconductors and atomic manipulation for future single-electron devices.
The book describes recent progress of near-field optical science and technology. The title of the book implies capabilities of optical near-field not only for imaging/microscopy but also for fabrication/manipulation/processing in nanometric scale. The authors introduce the differences between near-field optics and far-field optics from both an experimental and theoretical perspective. The book touches on a wide range of topics in near-field optics, and can be used both by the novice and experienced researcher already familiar with the subject, to connect the experimental with the theoretical aspects of near-field optics.
The Foundation for Advances in Medicine and Science (FAMS), the organizers of SCANNING 98, sponsored its third annual Atomic Force Microscopy/Scanning Tunneling Microscopy Symposium at the Omni Inner Harbor Hotelin Baltimore, Maryland, from May 9 to 12, 1998. This book represents the compilation of papers that were presented at the AFM/STM Symposium as well as a few that were presented at SCANNING 96 and SCANNING 97 meetings that took place in Monterey, California. The purpose of the symposium was to provide an interface between scientists and engineers, representatives of industry, government and academia, all of whom have a common interest in probe microscopies. The meetings offered an ideal forum where ideas could easily be exchanged and where individuals from diverse fields who are on the cutting edge ofprobe microscopy research could communicate with one another. Experts in probe microscopy from around the world representing a wide range of disciplines including physics, biotechnology, nanotechnology, chemistry, material science, etc., were invited to participate. The format of the meeting was structured so as to encourage communication among these individuals. During the first day's sessions papers were presented on general topics such as application of scanning probe microscopy in materials science; STM and scanning tunneling spectroscopy of organic materials; fractal analysis in AFM; and nanomanipulation. Other papers presented included unexpected ordering of a molecule; synthesis ofpeptides and oligonucleotides; and analysis oflunar soils from Apollo 11.
The International Conference on Laser Physics and Quantum Optics was held in Shanghai from August 25 to August 28, 1999, to discuss many exciting new developments in laser physics and quantum optics. The international character of the conference was manifested by the fact that scientists from over 13 countries participated and lectured at the conference. There were four keynote lectures delivered by Nobel laureate Willis Lamb, Jr., Profs. H. Walther, A.E. Siegman and M.O. Scully. In addition, there were 34 invited lectures, 27 contributed oral presentations, and 59 poster papers. This volume contains many of the papers presented at the conference.
Experienced and novice holographers receive a solid foundation in the theory and practice of holography, the next generation of imaging technology, in this superb text. The book's 'how to' aspects enable readers to learn hologram acquisition at the microscope and processing of holograms at the computer as well as digital imaging techniques. A complete bibliography on electron holography and applications of the method to problems in materials science, physics and the life sciences round out the volume's coverage.
Aquaculture is rapidly becoming a major source of fish protein used to meet the nutritional needs of humans. As the aquaculture industry grows, exposure of farmed fish to environmental contaminants, and the need for chemical therapeutic agents for fish, will increase. This book is designed to bring together authorities worldwide on the regulation of environmental contaminants and food chemicals and researchers investigating the metabolism and disposition of foreign chemicals (xenobiotics) in fish species.
This monograph stems from the lectures given during the summer course at the University of La Laguna, Canary Islands, Spain. It includes the main characterization techniques useful nowadays for ceramics, glasses, and glass-ceramics, and reviews the new microscopes for characterizing materials, and gives an overview of inorganic materials such as zeolites. The theory for XRD texture analysis and analytical methods are also covered. The book is not only up to date on these techniques but also on applications to inorganic materials, both amorphous and crystalline, such as glasses, glass-ceramics, and ceramics.
Introduces both optical microscopy and medical imaging with an emphasis on recurring themes such as resolution and contrast to reinforce understanding. Includes many illustrations and boxed material that give more detailed explanations. Features hands-on activities and experiments. Provides end-of-chapter problems for self-study. Offers supplementary online materials including a solutions manual.
The April 1997 conference held in Prague attracted the cream of primarily European and Russian researchers (with a handful from the US, primarily from the U. of Maryland School of Medicine) to the burgeoning biological and medical applications of innovative optical technology, particularly laser con
Bringing Scanning Probe Microscopy Up to Speed introduces the principles of scanning probe systems with particular emphasis on techniques for increasing speed. The authors include useful information on the characteristics and limitations of current state-of-the-art machines as well as the properties of the systems that will follow in the future. The basic approach is two-fold. First, fast scanning systems for single probes are treated and, second, systems with multiple probes operating in parallel are presented. The key components of the SPM are the mechanical microcantilever with integrated tip and the systems used to measure its deflection. In essence, the entire apparatus is devoted to moving the tip over a surface with a well-controlled force. The mechanical response of the actuator that governs the force is of the utmost importance since it determines the scanning speed. The mechanical response relates directly to the size of the actuator; smaller is faster. Traditional scanning probe microscopes rely on piezoelectric tubes of centimeter size to move the probe. In future scanning probe systems, the large actuators will be replaced with cantilevers where the actuators are integrated on the beam. These will be combined in arrays of multiple cantilevers with MEMS as the key technology for the fabrication process.
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
Distributed feedback (DFB) semiconductor lasers emit light in a single mode which is essential to providing the carrier in long haul high bit-rate optical communication systems. This comprehensive research monograph provides: thorough analysis of the operation and design of DFB lasers a high level of tutorial discussion with many valuable appendices the first full account of time-domain numerical modelling techniques applicable to future optical systems as well as present devices Web access to a suite of MATLAB programs (student version MATLAB 4 or higher). It is essential reading for those studying optical communications at graduate and advanced under-graduate level, and a key book for industrial designers of opto-electronic devices.
Scanning Probe Microscopy - Analytical Methods provides a comprehensive overview of the analytical methods on the nanometer scale based on scanning probe microscopy and spectroscopy. Numerous examples of applications of the chemical contrast mechanism down to the atomic scale in surface physics and chemistry are discussed with extensive references to original work in the recent literature.
2. High Temperature UHV-STM System 264 3. Hydrogen Desorption Process on Si (111) Surface 264 4. (7x7) - (1 xl) Phase Transition on Si (111) Surface 271 Step Shifting under dc Electric Fields 275 5. 6. Conclusions 280 Acknowledgements and References 281 12. DYNAMIC OBSERVATION OF VORTICES IN SUPERCONDUCTORS USING ELECTRON WAVES 283 by Akira Tonomura 1. Introduction 283 2. Experimental Method 284 2. 1 Interference Microscopy 284 2. 2 Lorentz Microscopy 287 Observation of Superconducting Vortices 288 3. 3. 1 Superconducting Vortices Observed by Interference Microscopy 288 3. 1. 1 Profile Mode 288 3. 1. 2 Transmission Mode 291 3. 2 Superconducting Vortices Observed by Lorentz Microscopy 293 3. 3 Observation of Vortex Interaction with Pinning Centers 294 3. 3. 1 Surface Steps 295 3. 3. 2 Irradiated Point Defects 296 4. Conclusion 298 References 299 13. TEM STUDIES OF SOME STRUCTURALLY FLEXIBLE SOLIDS AND THEIR ASSOCIATED PHASE TRANSFORMATIONS 301 by Ray L. Withers and John G. Thompson 1. Introduction 301 2. Tetrahedrally Comer-Connected Framework Structures 302 3. Tetragonal a-PbO 311 4. Compositionally Flexible Anion-Deficient Fluorites and the "Defect Fluorite" to C-type Sesquioxide Transition 320 5. Summary and Conclusions 327 Acknowledgements and References 327 Author Index 331 Subject Index 333 List of Contributors A. ASEEV Institute of Semiconductor Physics, Russian Academy of Sciences Novosibirsk, 630090, pr. ac. , Lavrentjeva 13, RUSSIA E. BAUER Department of Physics and Astronomy, Arizona State University Tempe, AZ 85287-1504, U. S. A. G. H.
This book represents the compilation of papers presented at the second Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7 to 9, 1994, in Natick, Massachusetts, at Natick Research, Development and Engineering Center, now part ofU.S. Army Soldier Systems Command. As with the 1993 symposium, the 1994 symposium provided a forum where scientists with a common interest in AFM, STM, and other probe microscopies could interact with one another, exchange ideas and explore the possibilities for future collaborations and working relationships. In addition to the scheduled talks and poster sessions, there was an equipment exhibit featuring the newest state-of-the-art AFM/STM microscopes, other probe microscopes, imaging hardware and software, as well as the latest microscope-related and sample preparation accessories. These were all very favorably received by the meeting's attendees. Following opening remarks by Natick's Commander, Colonel Morris E. Price, Jr., and the Technical Director, Dr. Robert W. Lewis, the symposium began with the Keynote Address given by Dr. Michael F. Crommie from Boston University. The agenda was divided into four major sessions. The papers (and posters) presented at the symposium represented a broad spectrum of topics in atomic force microscopy, scanning tunneling microscopy, and other probe microscopies.
Friction force microscopy is an important analytical tool in the field of tribology on the nanometer-scale. The contact area between the probing tip and the sample is reduced to some square nanometers, corresponding to the ideal of a single asperity contact. Traditional concepts, such as friction coefficients, adhesion and elasticity and stick-slip are re-examined with this novel technique. New concepts based upon classical and quantum mechanics are investigated.
Fluorescence microscopy images can be easily integrated into current video and computer image processing systems. People like visual observation; they like to watch a television or computer screen, and fluorescence techniques are thus becoming more and more popular. Since true in vivo experiments are simple to perform, samples can be directly seen and there is always the possibility of manipulating the samples during the experiments; it is an ideal technique for biology and medicine. Images are obtained by a classical (now called wide-field) fluorescence microscope, a confocal scanning microscope, upright or inverted, with epifluorescence or transmission. Computerized image processing may improve definition, and remove glare and scattered light signal. It also makes it possible to compute ratio images (ratio imaging both in excitation and in emission) or lifetime imaging. Image analysis programs may supply a great deal of additional data of various types, starting with calculations of the number of fluorescent objects, their shapes, brightness, etc. Fluorescence microscopy data may be complemented by classical measurement in the cuvette yr by flow cytometry.
Scanning Tunneling Microscopy III provides a unique introduction to
the theoretical foundations of scanning tunneling microscopy and
related scanning probe methods. The different theoretical concepts
developed in the past are outlined, and the implications of the
theoretical results for the interpretation of experimental data are
discussed in detail. Therefore, this book serves as a most useful
guide for experimentalists as well as for theoreticians working in
the field of local probe methods.
This book discusses the various principles in confocal scanning microscopy which has become a useful tool in many practical fields including biological studies and industrial inspection. The methodology presented in this book is unique and is based on the concept of the three-dimensional transfer functions which have been developed by the author and his colleagues over the last five years. With the 3-D transfer functions, resolving power in 3-D confocal imaging can be defined in a unified way, different optical arrangements can be compared with an insight into their inter-relationship, and images of thick objects can be modeled in terms of the Fourier transform which makes the analysis easy. The aim of this book is to provide a systematic introduction to the concept of the 3-D transfer functions in various confocal microscopes, to describe the methods for the derivation of different 3-D transfer functions, and to explain the principles of 3-D confocal imaging in terms of these functions. |
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