2. High Temperature UHV-STM System 264 3. Hydrogen Desorption Process on Si (111) Surface 264 4. (7x7) - (1 xl) Phase Transition on Si (111) Surface 271 Step Shifting under dc Electric Fields 275 5. 6. Conclusions 280 Acknowledgements and References 281 12. DYNAMIC OBSERVATION OF VORTICES IN SUPERCONDUCTORS USING ELECTRON WAVES 283 by Akira Tonomura 1. Introduction 283 2. Experimental Method 284 2. 1 Interference Microscopy 284 2. 2 Lorentz Microscopy 287 Observation of Superconducting Vortices 288 3. 3. 1 Superconducting Vortices Observed by Interference Microscopy 288 3. 1. 1 Profile Mode 288 3. 1. 2 Transmission Mode 291 3. 2 Superconducting Vortices Observed by Lorentz Microscopy 293 3. 3 Observation of Vortex Interaction with Pinning Centers 294 3. 3. 1 Surface Steps 295 3. 3. 2 Irradiated Point Defects 296 4. Conclusion 298 References 299 13. TEM STUDIES OF SOME STRUCTURALLY FLEXIBLE SOLIDS AND THEIR ASSOCIATED PHASE TRANSFORMATIONS 301 by Ray L. Withers and John G. Thompson 1. Introduction 301 2. Tetrahedrally Comer-Connected Framework Structures 302 3. Tetragonal a-PbO 311 4. Compositionally Flexible Anion-Deficient Fluorites and the "Defect Fluorite" to C-type Sesquioxide Transition 320 5. Summary and Conclusions 327 Acknowledgements and References 327 Author Index 331 Subject Index 333 List of Contributors A. ASEEV Institute of Semiconductor Physics, Russian Academy of Sciences Novosibirsk, 630090, pr. ac. , Lavrentjeva 13, RUSSIA E. BAUER Department of Physics and Astronomy, Arizona State University Tempe, AZ 85287-1504, U. S. A. G. H.

This thesis reports on the development of the first quantum enhanced microscope and on its applications in biological microscopy. The first quantum particle-tracking microscope, described in detail here, represents a pioneering advance in quantum microscopy, which is shown to be a powerful and relevant technique for future applications in science and medicine. The microscope is used to perform the first quantum-enhanced biological measurements -- a central and long-standing goal in the field of quantum measurement. Sub diffraction-limited quantum imaging is achieved, also for the first time, with a scanning probe imaging configuration allowing 10-nanometer resolution.

The first U. S. Army Natick Research, Development and Engineering Center Atomic Force/Scanning Tunneling Microscopy (AFM/STM) Symposium was held on lune 8-10, 1993 in Natick, Massachusetts. This book represents the compilation of the papers presented at the meeting. The purpose ofthis symposium was to provide a forum where scientists from a number of diverse fields could interact with one another and exchange ideas. The various topics inc1uded application of AFM/STM in material sciences, polymers, physics, biology and biotechnology, along with recent developments inc1uding new probe microscopies and frontiers in this exciting area. The meeting's format was designed to encourage communication between members of the general scientific community and those individuals who are at the cutting edge of AFM, STM and other probe microscopies. It immediately became clear that this conference enabled interdisciplinary interactions among researchers from academia, industry and government, and set the tone for future collaborations. Expert scientists from diverse scientific areas including physics, chemistry, biology, materials science and electronics were invited to participate in the symposium. The agenda of the meeting was divided into three major sessions. In the first session, Biological Nanostructure, topics ranged from AFM ofDNA to STM imagmg ofthe biomoleeule tubulin and bacterialluciferase to the AFM of starch polymer double helices to AFM imaging of food surfaces.

An Introduction to Digital Photomicrography is written for the hobbyist and the neophyte who wants to take pictures through the microscope. The book includes a description of the parts of the microscope; how to use adjust lighting; types of digital cameras; controls for adjusting digital cameras; choosing a video camera and controls for videography.

Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.

Following three printings of the First Edition (1978), the publisher has asked for a Second Edition to bring the contents up to date. In doing so the authors aim to show how the newer microscopies are related to the older types with respect to theoretical resolving power (what you pay for) and resolution (what you get). The book is an introduction to students, technicians, technologists, and scientists in biology, medicine, science, and engineering. It should be useful in academic and industrial research, consulting, and forensics; how ever, the book is not intended to be encyclopedic. The authors are greatly indebted to the College of Textiles of North Carolina State University at Raleigh for support from the administration there for typing, word processing, stationery, mailing, drafting diagrams, and general assistance. We personally thank Joann Fish for word process ing, Teresa M. Langley and Grace Parnell for typing services, Mark Bowen for drawing graphs and diagrams, Chuck Gardner for photographic ser vices, Deepak Bhattavahalli for his work with the proofs, and all the other people who have given us their assistance. The authors wish to acknowledge the many valuable suggestions given by Eugene G. Rochow and the significant editorial contributions made by Elizabeth Cook Rochow."

Bringing Scanning Probe Microscopy Up to Speed introduces the principles of scanning probe systems with particular emphasis on techniques for increasing speed. The authors include useful information on the characteristics and limitations of current state-of-the-art machines as well as the properties of the systems that will follow in the future. The basic approach is two-fold. First, fast scanning systems for single probes are treated and, second, systems with multiple probes operating in parallel are presented. The key components of the SPM are the mechanical microcantilever with integrated tip and the systems used to measure its deflection. In essence, the entire apparatus is devoted to moving the tip over a surface with a well-controlled force. The mechanical response of the actuator that governs the force is of the utmost importance since it determines the scanning speed. The mechanical response relates directly to the size of the actuator; smaller is faster. Traditional scanning probe microscopes rely on piezoelectric tubes of centimeter size to move the probe. In future scanning probe systems, the large actuators will be replaced with cantilevers where the actuators are integrated on the beam. These will be combined in arrays of multiple cantilevers with MEMS as the key technology for the fabrication process.

Since the publication in 1979 of Introduction to Analytical Electron Microscopy (ed. J. J. Hren, J. I. Goldstein, and D. C. Joy; Plenum Press), analytical electron microscopy has continued to evolve and mature both as a topic for fundamental scientific investigation and as a tool for inorganic and organic materials characterization. Significant strides have been made in our understanding of image formation, electron diffraction, and beam/specimen interactions, both in terms of the "physics of the processes" and their practical implementation in modern instruments. It is the intent of the editors and authors of the current text, Principles of Analytical Electron Microscopy, to bring together, in one concise and readily accessible volume, these recent advances in the subject. The text begins with a thorough discussion of fundamentals to lay a foundation for today's state-of-the-art microscopy. All currently important areas in analytical electron microscopy-including electron optics, electron beam/specimen interactions, image formation, x-ray microanalysis, energy-loss spectroscopy, electron diffraction and specimen effects-have been given thorough attention. To increase the utility of the volume to a broader cross section of the scientific community, the book's approach is, in general, more descriptive than mathematical. In some areas, however, mathematical concepts are dealt with in depth, increasing the appeal to those seeking a more rigorous treatment of the subject.

Microscope Image Processing, Second Edition, introduces the basic fundamentals of image formation in microscopy including the importance of image digitization and display, which are key to quality visualization. Image processing and analysis are discussed in detail to provide readers with the tools necessary to improve the visual quality of images, and to extract quantitative information. Basic techniques such as image enhancement, filtering, segmentation, object measurement, and pattern recognition cover concepts integral to image processing. In addition, chapters on specific modern microscopy techniques such as fluorescence imaging, multispectral imaging, three-dimensional imaging and time-lapse imaging, introduce these key areas with emphasis on the differences among the various techniques. The new edition discusses recent developments in microscopy such as light sheet microscopy, digital microscopy, whole slide imaging, and the use of deep learning techniques for image segmentation and analysis with big data image informatics and management. Microscope Image Processing, Second Edition, is suitable for engineers, scientists, clinicians, post-graduate fellows and graduate students working in bioengineering, biomedical engineering, biology, medicine, chemistry, pharmacology and related fields, who use microscopes in their work and would like to understand the methodologies and capabilities of the latest digital image processing techniques or desire to develop their own image processing algorithms and software for specific applications.

This monograph stems from the lectures given during the summer course at the University of La Laguna, Canary Islands, Spain. It includes the main characterization techniques useful nowadays for ceramics, glasses, and glass-ceramics, and reviews the new microscopes for characterizing materials, and gives an overview of inorganic materials such as zeolites. The theory for XRD texture analysis and analytical methods are also covered. The book is not only up to date on these techniques but also on applications to inorganic materials, both amorphous and crystalline, such as glasses, glass-ceramics, and ceramics.

Electron microscopy is frequently portrayed as a discipline that stands alone, separated from molecular biology, light microscopy, physiology, and biochemistry, among other disciplines. It is also presented as a technically demanding discipline operating largely in the sphere of "black boxes" and governed by many absolute laws of procedure. At the introductory level, this portrayal does the discipline and the student a disservice. The instrumentation we use is complex, but ultimately understandable and, more importantly, repairable. The procedures we employ for preparing tissues and cells are not totally understood, but enough information is available to allow investigators to make reasonable choices concerning the best techniques to apply to their parti cular problems. There are countless specialized techniques in the field of electron and light microscopy that require the acquisition of specialized knowledge, particularly for interpretation of results (electron tomography and energy dispersive spectroscopy immediately come to mind), but most laboratories possessing the equipment to effect these approaches have specialists to help the casual user. The advent of computer operated electron microscopes has also broadened access to these instruments, allowing users with little technical knowledge about electron microscope design to quickly become operators. This has been a welcome advance, because earlier instru ments required a level of knowledge about electron optics and vacuum systems to produce optimal photographs and to avoid "crashing" the instruments that typically made it difficult for beginners."

This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.

Deals with both the ultrashort laser-pulse technology in the few- to mono-cycle region and the laser-surface-controlled scanning-tunneling microscopy (STM) extending into the spatiotemporal extreme technology. The former covers the theory of nonlinear pulse propagation beyond the slowly-varing-envelope approximation, the generation and active chirp compensation of ultrabroadband optical pulses, the amplitude and phase characterization of few- to mono-cycle pulses, and the feedback field control for the mono-cycle-like pulse generation. In addition, the wavelength-multiplex shaping of ultrabroadband pulses, and the carrier-phase measurement and control of few-cycle pulses are described. The latter covers the CW-laser-excitation STM, the femtosecond-time-resolved STM and atomic-level surface phenomena controlled by femtosecond pulses.

The Nobel Prize of 1986 on Sc- ningTunnelingMicroscopysignaled a new era in imaging. The sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At ?rst there were two - the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the M- netic Force Microscope, MFM, and the Electrostatic Force Microscope, EFM. The MFM will image a single magnetic bit with features as small as 10nm. With the EFM one can monitor the charge of a single electron. Prof. Paul Hansma at Santa Barbara opened the door even wider when he was able to image biological objects in aqueous environments. At this point the sluice gates were opened and a multitude of different instruments appeared. There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM. The probe microscopes do not require preparation of the sample and they operate in ambient atmosphere, whereas, the SEM must operate in a vacuum environment and the sample must be cross-sectioned to expose the proper surface. However, the SEM can record 3D image and movies, features that are not available with the scanning probes.

Much of this book was written during a sabbatical visit by J. C. H. S. to the Max Planck Institute in Stuttgart during 1991. We are therefore grateful to Professors M. Ruhle and A. Seeger for acting as hosts during this time, and to the Alexander von Humbolt Foundation for the Senior Scientist Award which made this visit possible. The Ph. D. work of one of us (J. M. Z. ) has also provided much of the background for the book, together with our recent papers with various collaborators. Of these, perhaps the most important stimulus to our work on convergent-beam electron diffraction resulted from a visit to the National Science Foundation's Electron Microscopy Facility at Arizona State University by Professor R. H(lJier in 1988, and from a return visit to Trondheim by J. C. H. S. in 1990. We are therefore particularly grateful to Professor H(lJier and his students and co-workers for their encouragement and collaboration. At ASU, we owe a particular debt of gratitude to Professor M. O'Keeffe for his encouragement. The depth of his under standing of crystal structures and his role as passionate skeptic have frequently been invaluable. Professor John Cowley has also been an invaluable sounding board for ideas, and was responsible for much of the experimental and theoretical work on coherent nanodiffraction. The sections on this topic derive mainly from collaborations by J. C. H. S. with him in the seventies."

Insects, and their close relatives, the arachnids, centipedes, millipedes and woodlice, make ideal material for study by the recreational microscopist. Moreover for the entomologist, the addition of the use of the microscope to their tool kit adds a whole new dimension to their study, revealing in finest detail the appearance and structure of these tiny creatures. This book reveals the basics of insect microscopy, explaining what equipment is needed and how to get the best out of it. Topics covered include insects and their relatives; trapping insects for study; dissection, slide mounting publishing your work.

vi on geometric probability is included, students can be expected to create a few simple programs like those shown, but for other geometries. I am indebted to Tom Hare for critical reviews of the material and an endless enthusiasm to debate and derive stereological relationships; to John Matzka at Plenum Press for patiently instructing me in the intricacies of typesetting; to Chris Russ for helping to program many of these measurement techniques; and especially to Helen Adams, both for her patience with my creative fever to write yet another book, and for pointing out that the title, which I had intended to contrast to "theoretical stereology," can also be understood as the antonym of "impractical stereology." John C. Russ Raleigh, NC July, 1986 Chapter 1: Statistics 1 Accuracy and precision 1 The mean and standard deviation 5 Distributions 7 Comparison 13 Correlation 18 Nonlinear fitting 19 Chapter 2: Image Types 23 Planar sections 23 Projected images 25 Finite sections 28 Space-filling structures and dispersed phases 29 Types of images and contrast mechanisms 31 Sampling 32 Chapter 3: Manual Methods 35 Volume fraction 35 Surface density 38 Contiguity 41 Mean intercept length 42 Line density 43 Grain size determination 55 Curvature 48 Reticles to aid counting 49 Magnification and units 51 Chapter4: Size Distributions 53 Intercept length in spheres 53 Nonspherical shapes 57 Corrections for finite section thickness 59 Lamellae 61 Measurement of profile size 62 Nonspherical particles 69 vii Contents viii Chapter 5: Computer Metlwds 73

Arbeitshypothesen sind revidierbar, deklarierten Wahrheiten nicht, sie verkalken zum System; Arbeitshypothesen passen sich den Menschen an, den deklarierten Wahrheiten wird der Mensch angepajJt; die ersten kann mann verwerfen, von den anderen wird man verworfen. FRIEDRICH DORRBNMATI, Nachgedanken Working hypotheses can be revised, ' declared truths cannot-they calcify into dogma. Working hypotheses adapt to people-people adapt to declared truths. One can reject the first but be rejected by the latter. The concept of electron crystallography, i.e., the quantitative use of electron diffraction intensities to solve crystal structures, is by no means new. Based on extensive pioneering efforts on organic and inorganic substances, two major works on electron diffraction structure analysis (or "electronography" as it was then known in Moscow) appeared in English translation during the 19608. These books are B. K. Vainshtein, Strukturnaya Elektronografiya (Structure Analysis by Electron Diffrac tion, translated by E. Feigl andJ. A. Spink, Pergamon Press, Oxford, 1964), and B. B."

This easy-to-follow manual describes tested procedures used to prepare biological samples for scanning and transmission electron microscopy, as well as methods for cytochemistry, immunocytochemistry, and scientific photography. The work is structured to clearly define testing objectives, necessary materials, procedural steps, and expected results; a list of references and trouble shooting techniques round out the text.

Nanostructuring of materials is a task at the heart of many modern disciplines in mechanical engineering, as well as optics, electronics, and the life sciences. This book includes an introduction to the relevant nonlinear optical processes associated with very short laser pulses for the generation of structures far below the classical optical diffraction limit of about 200 nanometers as well as coverage of state-of-the-art technical and biomedical applications. These applications include silicon and glass wafer processing, production of nanowires, laser transfection and cell reprogramming, optical cleaning, surface treatments of implants, nanowires, 3D nanoprinting, STED lithography, friction modification, and integrated optics. The book highlights also the use of modern femtosecond laser microscopes and nanoscopes as novel nanoprocessing tools.

The 2nd International Multidisciplinary Microscopy and Microanalysis Congress & Exhibition (InterM 2014) was held on 16-19 October 2014 in Oludeniz, Fethiye/ Mugla, Turkey. The aim of the congress was to gather scientists from various branches and discuss the latest improvements in the field of microscopy. The focus of the congress has been widened in an "interdisciplinary" manner, so as to allow all scientists working on several related subjects to participate and present their work. These proceedings include 33 peer-reviewed technical papers, submitted by leading academic and research institutions from over 17 countries and representing some of the most cutting-edge research available. The papers were presented at the congress in the following sessions: * Applications of Microscopy in the Physical Sciences * Applications of Microscopy in the Biological Sciences

The International Conference on Laser Physics and Quantum Optics was held in Shanghai from August 25 to August 28, 1999, to discuss many exciting new developments in laser physics and quantum optics. The international character of the conference was manifested by the fact that scientists from over 13 countries participated and lectured at the conference. There were four keynote lectures delivered by Nobel laureate Willis Lamb, Jr., Profs. H. Walther, A.E. Siegman and M.O. Scully. In addition, there were 34 invited lectures, 27 contributed oral presentations, and 59 poster papers. This volume contains many of the papers presented at the conference.

Polymer Microscopy, 3rd Edition, is a comprehensive and practical guide to the study of the microstructure of polymers, and is the result of the authors' many years of academic and industrial experience. To address the needs of students and professionals from a variety of backgrounds, introductory chapters deal with the basic concepts of both polymer morphology and processing and microscopy and imaging theory. The core of the book is more applied, with many examples of specimen preparation and image interpretation leading to materials characterization.Microscopy is applied to the characterization of a wide range of polymer systems, including fibers, films, engineering resins and plastics, composites, nanocomposites, polymer blends, emulsions and liquid crystaline polymers. Light microscopy, atomic force microscopy, scanning and transmission electron microscopy techniques are all considered, as are emerging techniques such as compositional mapping in which microscopy is combined with spectroscopy. This extensively updated and revised third edition closes with a problem solving guide, which gives a systematic framework for deciding on suitable approaches to the characterization of