The International Conference on Laser Physics and Quantum Optics was held in Shanghai from August 25 to August 28, 1999, to discuss many exciting new developments in laser physics and quantum optics. The international character of the conference was manifested by the fact that scientists from over 13 countries participated and lectured at the conference. There were four keynote lectures delivered by Nobel laureate Willis Lamb, Jr., Profs. H. Walther, A.E. Siegman and M.O. Scully. In addition, there were 34 invited lectures, 27 contributed oral presentations, and 59 poster papers. This volume contains many of the papers presented at the conference.

Polymer Microscopy, 3rd Edition, is a comprehensive and practical guide to the study of the microstructure of polymers, and is the result of the authors' many years of academic and industrial experience. To address the needs of students and professionals from a variety of backgrounds, introductory chapters deal with the basic concepts of both polymer morphology and processing and microscopy and imaging theory. The core of the book is more applied, with many examples of specimen preparation and image interpretation leading to materials characterization.Microscopy is applied to the characterization of a wide range of polymer systems, including fibers, films, engineering resins and plastics, composites, nanocomposites, polymer blends, emulsions and liquid crystaline polymers. Light microscopy, atomic force microscopy, scanning and transmission electron microscopy techniques are all considered, as are emerging techniques such as compositional mapping in which microscopy is combined with spectroscopy. This extensively updated and revised third edition closes with a problem solving guide, which gives a systematic framework for deciding on suitable approaches to the characterization of

Three-dimensional x-ray diffraction (3DXRD) microscopy is a novel experimental method for structural characterisation of polycrystalline materials. The position, morphology, phase, strain and crystallographic orientation of hundreds of grains or sub-grain embedded within mm-cm thick specimens can be determined simultaneously. Furthermore, the dynamics of the individual structural elements can be monitored during typical processes such as deformation or annealing.

The book gives a comprehensive account of the methodology followed by a summary of selected applications. The method is presented from a mathematical/crystallographic point-of-view but with sufficient hands-on details to enable the reader to plan his or her own experiments. The scope of applications includes work in materials science and engineering, geophysics, geology, chemistry and pharmaceutical science.

Since the pioneering discoveries of Hodgkin, Huxley, and Katz, it has been clear that specific ion conductance pathways underlie electrical act- ity. Over the ensuing 50 years, there has been ever increasing, and occasi- ally explosive, changes in the scope of efforts to understand ion channel behavior. The introduction of patch clamp technology by Erwin Neher and Bert Sakmann about 20 years ago led to the realization of the great variety of novel ion channel species, and the subsequent revolution in cl- ing has revealed an even greater diversity of the underlying molecular entities. Today, advances in the study of ion channel structure and function c- tinue at a high pace, from angstrom resolution imaging of crystallized ch- nels to their genetic manipulations in animals. In this regard, the field is a balanced one that inquires not only what ion channel entities are there, or how they operate, but also where are these molecular electronic switches? However, this balance is not particularly well presented to the general sci- tific audience or to specialists in the field. There are plenty of wonderful and useful books and monographs, as well as conferences and meetings on v- tually every aspect of ion channel structure and function. However, we are unaware that the channel localization theme has been considered in a u- fied forum.

This is a book about fishermen's reasons for obeying fisheries law. The fish harvesting industry has become subject to state interference to an increasing extent over the past twenty years. As natural resources become scarce and subsequent fisheries regulations abound, the question of law-abidingness is brought to the public agenda. However, there is still little empirical data as regards the dynamics of compliance in this field, and this book aims to meet a demand for in-depth knowledge. The cases studied can be regarded as instances of economies dependent on the harvesting of natural resources for both household and the market, and the study aims to contribute to the building of more adequate theory on the dynamics of compliance in such economies. However, focusing on a specific type of setting seldom constitutes a safe escape route for getting away from more pervasive sociological questions, and it certainly does not in this case. As any attempt to explain social phenomena, this study is faced with the fundamental sociological question of how the acts of individuals can best be understood. The question concerns the interface between the individual and the collectivity - between collective morality and self-interest. It thus deals with classical sociological issues such as the nature and regulatory capacity of group norms and sanctions, and the forms and roles of rationality and strategic action.

This volume examines the physical and technical foundation for recent progress in applied near-field scanning probe techniques. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. After laying the theoretical background of static and dynamic force microscopies, including sensor technology and tip characterization, contributions detail applications such as macro- and nanotribology, polymer surfaces, and roughness investigations. The final part on industrial research addresses special applications of scanning force nanoprobes such as atomic manipulation and surface modification, as well as single electron devices based on SPM. Scientists and engineers either using or planning to use SPM techniques will benefit from the international perspective assembled in the book.

Despite their importance in terms of employment and income generation, inshore fisheries have been a neglected area of study. The review of the common fisheries policy, especially in the light of the need to re-examine the derogation which reserves access to the inshore zone to coastal state vessels, provides an opportunity to redress the balance. With contributions from leading authorities on fisheries management, the book takes an in-depth look at seven European countries, examining the basis for the definition of inshore fisheries, evaluating their status, and describing the salient characteristics of their management. The national studies form the basis for cross-cultural analyses of the social organisation, cultural norms, economic objectives, and institutional structures of inshore fisheries in Europe. Finally, a number of key issues relating to the future of inshore fisheries management in a more integrated approach are examined. Overall the volume reaffirms the invaluable role played by inshore fisheries in the local and regional economies of Europe's complex coastline.

Experienced and novice holographers receive a solid foundation in the theory and practice of holography, the next generation of imaging technology, in this superb text. The book's 'how to' aspects enable readers to learn hologram acquisition at the microscope and processing of holograms at the computer as well as digital imaging techniques. A complete bibliography on electron holography and applications of the method to problems in materials science, physics and the life sciences round out the volume's coverage.

This book presents comprehensive studies of charge density waves (CDW) in a high-Tc cuprate superconductor using x-ray scattering techniques under uniaxial pressure. Specifically, the work addresses inelastic x-ray scattering studies under uniaxial pressure performed on the underdoped cuprate YBa2Cu3O6.67(p=0.12, Tc=65K) with incoming photon energy in the resonant (E=931.3 eV, Cu-L3 edge) and non-resonant conditions (E=17.794 keV). This is a completely new approach to the investigation of charge density waves. It revealed new features of charge density waves in cuprates, whose properties had previously been inaccessible..

The main objective of this book is to systematically describe the basic principles of the most widely used techniques for the analysis of physical, structural, and compositional properties of solids with a spatial resolution of approxi mately 1 m or less. Many books and reviews on a wide variety of microanalysis techniques have appeared in recent years, and the purpose of this book is not to replace them. Rather, the motivation for combining the descriptions of various mi croanalysis techniques in one comprehensive volume is the need for a reference source to help identify microanalysis techniques, and their capabilities, for obtaining particular information on solid-state materials. In principle, there are several possible ways to group the various micro analysis techniques. They can be distinguished by the means of excitation, or the emitted species, or whether they are surface or bulk-sensitive techniques, or on the basis of the information obtained. We have chosen to group them according to the means of excitation. Thus, the major parts of the book are: Electron Beam Techniques, Ion Beam Techniques, Photon Beam Techniques, Acoustic Wave Excitation, and Tunneling of Electrons and Scanning Probe Microscopies. We hope that this book will be useful to students (final year undergrad uates and graduates) and researchers, such as physicists, material scientists, electrical engineers, and chemists, working in a wide variety of fields in solid state sciences."

More than half of the world's petroleum is to be found in carbonate rocks, for example in the Middle East, the former USSR and in North America. These rocks show a bewildering diversity of grains and textures, due in part to the wealth of different fossil organisms which have contributed to carbonate sedimentation, and in part to a wide variety of diagenetic processes which can radically modify textures and obscure the depositional fabric. Careful petrographic study with a polarising microscope is a key element of any study of carbonate sediments, as a companion to field or core logging, and as a necessary precursor to geochemical analysis. This atlas, which illustrates in full colour a range of features not attempted in any general textbook, is designed as a laboratory manual to keep beside the microscope, as an aid to identifying grain types and textures in carbonates. It appeals alike to undergraduate and graduate students and to professionals in teaching institutions, research laboratories and industry.

The first volume in the series was released in January 2004 and the second to fourth volumes in early 2006. The field is now progressing so fast that there is a need for one volume every 12 to 18 months to capture latest developments.

Volume VII presents 9 chapters on a variety of new and emerging techniques and refinements of SPM applications.

Elastic and inelastic scattering in transmission electron microscopy (TEM) are important research subjects. For a long time, I have wished to systematically summarize various dynamic theories associated with quantitative electron micros copy and their applications in simulations of electron diffraction patterns and images. This wish now becomes reality. The aim of this book is to explore the physics in electron diffraction and imaging and related applications for materials characterizations. Particular emphasis is placed on diffraction and imaging of inelastically scattered electrons, which, I believe, have not been discussed exten sively in existing books. This book assumes that readers have some preknowledge of electron microscopy, electron diffraction, and quantum mechanics. I anticipate that this book will be a guide to approaching phenomena observed in electron microscopy from the prospects of diffraction physics. The SI units are employed throughout the book except for angstrom (A), which is used occasionally for convenience. To reduce the number of symbols used, the Fourier transform of a real-space function P'(r), for example, is denoted by the same symbol P'(u) in reciprocal space except that r is replaced by u. Upper and lower limits of an integral in the book are (-co, co) unless otherwise specified. The (-co, co) integral limits are usually omitted in a mathematical expression for simplification. I very much appreciate opportunity of working with Drs. J. M. Cowley and J. C. H. Spence (Arizona State University), J."

The first volume in the series was released in January 2004 and the second to fourth volumes in early 2006. The field is now progressing so fast that there is a need for one volume every 12 to 18 months to capture latest developments.

Volume VI presents 10 chapters on a variety of new and emerging techniques and refinements of SPM applications.

Introduces both optical microscopy and medical imaging with an emphasis on recurring themes such as resolution and contrast to reinforce understanding. Includes many illustrations and boxed material that give more detailed explanations. Features hands-on activities and experiments. Provides end-of-chapter problems for self-study. Offers supplementary online materials including a solutions manual.

This first book on high-speed atomic force microscopy (HS-AFM) is intended for students and biologists who want to use HS-AFM in their research. It provides straightforward explanations of the principle and techniques of AFM and HS-AFM. Numerous examples of HS-AFM studies on proteins demonstrate how to apply this new form of microscopy to specific biological problems. Several precautions for successful imaging and the preparation of cantilever tips and substrate surfaces will greatly benefit first-time users of HS-AFM. In turn, the instrumentation techniques detailed in Chapter 4 can be skipped, but will be useful for engineers and scientists who want to develop the next generation of high-speed scanning probe microscopes for biology. The book is intended to facilitate the first-time use of this new technique, and to inspire students and researchers to tackle their own specific biological problems by directly observing dynamic events occurring in the nanoscopic world. Microscopy in biology has recently entered a new era with the advent of high-speed atomic force microscopy (HS-AFM). Unlike optical microscopy, electron microscopy, and conventional slow AFM, it allows us to directly observe biological molecules in physiological environments. Molecular "movies" created using HS-AFM can directly reveal how molecules behave and operate, without the need for subsequent complex analyses and roundabout interpretations. It also allows us to directly monitor morphological change in live cells, and dynamic molecular events occurring on the surfaces of living bacteria and intracellular organelles. As HS-AFM instruments were recently commercialized, in the near future HS-AFM is expected to become a common tool in biology, and will enhance and accelerate our understanding of biological phenomena.

This research-level reference provides a review of the morphological techniques that have become a primary method of anatomical study correlating structure and function in lung physiology and pathology. Detailing the evolution of anatomy as a research discipline, it explores general structural techn

This volume contains invited and contributed papers presented at the conference on 'Microscopy of Semiconducting Materials' held at the University of Cambridge on 2-5 April 2007. The event was organised under the auspices of the Electron Microscopy and Analysis Group of the Institute of Physics, the Royal Microscopical Society and the Materials Research Society. This international conference was the fifteenth in the series that focuses on the most recent world-wide advances in semiconductor studies carried out by all forms of microscopy and it attracted delegates from more than 20 countries. With the relentless evolution of advanced electronic devices into ever smaller nanoscale structures, the problem relating to the means by which device features can be visualised on this scale becomes more acute. This applies not only to the imaging of the general form of layers that may be present but also to the determination of composition and doping variations that are employed. In view of this scenario, the vital importance of transmission and scanning electron microscopy, together with X-ray and scanning probe approaches can immediately be seen. The conference featured developments in high resolution microscopy and nanoanalysis, including the exploitation of recently introduced aberration-corrected electron microscopes. All associated imaging and analytical techniques were demonstrated in studies including those of self-organised and quantum domain structures. Many analytical techniques based upon scanning probe microscopies were also much in evidence, together with more general applications of X-ray diffraction methods.

The April 1997 conference held in Prague attracted the cream of primarily European and Russian researchers (with a handful from the US, primarily from the U. of Maryland School of Medicine) to the burgeoning biological and medical applications of innovative optical technology, particularly laser con

The Beginnings of Electron Microscopy - Part 2, Volume 221 in the Advances in Imaging and Electron Physics series, highlights new advances in the field, with this new volume presenting interesting chapters on Recollections from the Early Years: Canada-USA, My Recollection of the Early History of Our Work on Electron Optics and the Electron Microscope, Walter Hoppe (1917-1986), Reminiscences of the Development of Electron Optics and Electron Microscope Instrumentation in Japan, Early Electron Microscopy in The Netherlands, L. L. Marton, 1901-1979, The Invention of the Electron Fresnel Interference Biprism, The Development of the Scanning Electron Microscope, and much more.

The volumes V, VI and VII will examine the physical and technical foundation for recent progress in applied scanning probe techniques. These volumes constitute a timely comprehensive overview of SPM applications. This is the first book summarizing the state-of-the-art of this technique. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.

This completely revised successor to the Handbook of Microscopy supplies in-depth coverage of all imaging technologies from the optical
to the electron and scanning techniques. Adopting a twofold approach, the book firstly presents the various technologies as such, before going
on to cover the materials class by class, analyzing how the different imaging methods can be successfully applied. It covers the latest developments in techniques, such as in-situ TEM, 3D imaging in TEM and SEM, as well as a broad range of material types, including metals,
alloys, ceramics, polymers, semiconductors, minerals, quasicrystals, amorphous solids, among others. The volumes are divided between
methods and applications, making this both a reliable reference and handbook for chemists, physicists, biologists, materials scientists and
engineers, as well as graduate students and their lecturers.

In 1968, the National Bureau of Standards (NBS) published Special Publication 298 "Quantitative Electron Probe Microanalysis," which contained proceedings of a seminar held on the subject at NBS in the summer of 1967. This publication received wide interest that continued through the years far beyond expectations. The present volume, also the result of a gathering of international experts, in 1988, at NBS (now the National Institute of Standards and Technology, NIST), is intended to fulfill the same purpose. After years of substantial agreement on the procedures of analysis and data evaluation, several sharply differentiated approaches have developed. These are described in this publi cation with all the details required for practical application. Neither the editors nor NIST wish to endorse any single approach. Rather, we hope that their exposition will stimulate the dialogue which is a prerequisite for technical progress. Additionally, it is expected that those active in research in electron probe microanalysis will appreciate more clearly the areas in which further investigations are warranted."