The growth of interest and research activity in X -ray microscopy is reflected in the increasing size and scope of a related series of international conferences, the latest of which (XRM90) was held at King's College London (3-7 September 1990) with over 130 delegates. Previous conferences in Gottingen and Brookhaven resulted in books in the Springer Series in Optical Sciences, and this volume, the proceedings of XRM90, maintains this tradition. Because of the large number of papers their lengths were strictly limited and, while most papers can be directly identified with conference presentations, in a few cases those on similar topics by the same authors have been combined into a longer paper to allow better use of the space. The book is divided into six parts, with Parts IT-VI covering the major areas of interest at the conference. In Part 1 are two overviews; Ron Burge presented the opening paper of the conference, while the closing, summary, contrlbution by Janos Kirz is included here as a comprehensive introduction to the remainder of the book. Part IT covers developments in X -ray sources and optics. The high average brightnesses of synchrotron radiation sources have made many applications pos sible, while the more convenient, laboratory-based, plasma sources offer much promise for the future. Several contributions report significant advances in X-ray optics, which must clearly continue fully to exploit the latest sources.

X-ray microscopy fills a gap between optical and electron microscopy. Using soft x-rays, a resolution higher than with visible light can be obtained. In comparison to electron microscopy, thick, wet, unstained specimens can be examined. This is especially advantageous for biological applications. The intense synchrotron radiation of electron storage rings and the de- velopment of optical elements for soft x-rays render x-ray microscopy feasi- ble for basic research. Wider applications will be possible in the future with the development of laboratory x-ray sources and microscopes. In 1979 a conference on x-ray microscopy was organized by the New York Academy of Sciences and in 1981 a symposium on high resolution soft x-ray optics was held at Brookhaven. The present volume contains the contributions to the sympos i um "X-Ray Microscopy", organ i zed by the Akademie der Wi ssen- schaften in Gottingen in September 1983. In their capacity as conference chairmen, the editors would like to thank the Akademie der Wissenschaften, especially Prof. H.G. Wagner, Secretary of the Academy, and Mr. J. Pfahlert for organizing the symposium. We are in- debted to the Stiftung Volkswagenwerk for financial support. The symposium was held at the Max-Planck-Institut fUr Stromungsforschung. We are grateful for their hospitality and assistance during the symposium. Thanks are due to all authors and to the Springer Verlag for their combined efforts. We thank Dipl.-Phys. P. Guttmann, Dr. B. Niemann and Mrs. A. Marienhagen for their assistance during the final preparation of the manuscripts.

Medical Applications of Microcomputers deals with microcomputer applications in a wide area of clinical medicine. Recent developments are discussed in several clinical specialties including medicine, surgery, urology, anaesthesia and oncology. Topics include the storage of analysis of clinical audit data, the display of processing of data from direct physiological measurements and computers in control of therapy. The authors draw on their practical experience and knowledge of specific areas to which they have applied modern microcomputer techniques and give detailed descriptions of the means by which the problems that may be encountered may be overcome. Those wishing to implement their own computer systems will find this book a useful further source of ideas and techniques which add to those described in the earlier volume "Microcomputers in Medicine" by the same editors.

Confocal Microscopy: Methods and Protocols, Second Edition takes the researcher from the bench top through the imaging process, to the page. Protocols for the preparation of tissues from many model organisms including worms, flies and mice have been included as well as chapters on confocal imaging of living cells, three dimensional analysis, and the measurement and presentation of confocal images for publication. Emphasis has been placed on the laser scanning confocal microscope since this is still the instrument used for most routine applications. The current generation of modern confocal instruments produces optical sections of cells and tissues that are free of out-of-focus fluorescence with reduced chances of artifacts from the techniques of specimen preparation. This allows the imaging of living specimens and measurements of physiological events within cells. Confocal microscopy has become essential in many fields of contemporary biomedical research where a light microscope is required for imaging fluorescently labeled cells and tissues, especially cell biology, developmental biology, neurobiology, and pathology. Written in the successful Methods in Molecular Biology series format, chapters include introductions to their respective topics, lists of the necessary materials and reagents, step-by-step, readily reproducible protocols, and notes on troubleshooting and avoiding known pitfalls. Authoritative and easily accessible, Confocal Microscopy: Methods and Protocols, Second Edition is aimed primarily, but not exclusively, at the novice user with pointers to more advanced techniques.

This book describes the developmental history of the vacuum system of the transmission electron microscope (TEM) at the Japan Electron Optics Laboratory (JEOL) from its inception to its use in today's high-technology microscopes. The author and his colleagues were engaged in developing vacuum technology for electron microscopes (JEM series) at JEOL for many years. This volume presents a summary and explanation of their work and the technology that makes possible a clean ultrahigh vacuum. The typical users of the TEM are top-level researchers working at the frontiers of new materials or with new biological specimens. They often use the TEM under extremely severe conditions, with problems sometimes occurring in the vacuum system of the microscopes. JEOL engineers then must work as quickly as possible to improve the vacuum evacuation system so as to prevent the recurrence of such problems. Among the wealth of explanatory material in this book are examples of users' reports of problems in the vacuum system of the JEM, such as the occurrence of a micro-discharge and the back-streaming of the diffusion pump (DP) oil vapor. This work is a valuable resource for researchers who use the transmission electron microscope and for engineers and scientists interested in its technology.

The combination of atomic force microscopy with ultrasonic methods allows the nearfield detection of acoustic signals. The nondestructive characterization and nanoscale quantitative mapping of surface adhesion and stiffness or friction is possible. The aim of this book is to provide a comprehensive review of different scanning probe acoustic techniques, including AFAM, UAFM, SNFUH, UFM, SMM and torsional tapping modes. Basic theoretical explanations are given to understand not only the probe dynamics but also the dynamics of tip surface contacts. Calibration and enhancement are discussed to better define the performance of the techniques, which are also compared with other classical techniques such as nanoindentation or surface acoustic wave. Different application fields are described, including biological surfaces, polymers and thin films.

In modern scanning electron microscopy, sample surface preparation is of key importance, just as it is in transmission electron microscopy. With the procedures for sample surface preparation provided in the present book, the enormous potential of advanced scanning electron microscopes can be realized fully. This will take the reader to an entirely new level of scanning electron microscopy and finely-detailed images never seen before.

"Modeling Nanoscale Imaging in Electron Microscopy" presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.

In 1979, a conference on x-ray microscopy was organized by the New York Academy of Sciences, and in 1983, the Second Interna tional Symposium on X-ray Imaging was organized by the Akademie der Wissenschaften in Gottingen, Federal Republic of Germany. This volume contains the contributions to the symposium "X-ray Microscopy '86," held in Taipei, Taiwan, the Republic of China in August 1986. This is the first volume which intends to provide up-to date information on x-ray imaging to biologists, therefore, emphasis was given to specimen preparation techniques and image interpreta tion. Specimen preparation represents a major part of every microscopy work, therefore, it should be strongly emphasized in this emerging field of x-ray microscopy. Theoretically, x-ray microscopy offers the potential for the study of unfixed, hydrated biological ma terials. Since very few biological system can be directly observed without specimen preparation, we would like to emphasize that new information on biological specimens can only be obtained if the speci men is properly prepared. In the past decade, many of the published x-ray images were obtained from poorly prepared biological speci mens, mainly air-dried materials. Therefore, one of the goals of this conference is to bring the importance of specimen preparation to the attention of x-ray microscopy community. X-ray microscopy can be subdivided into several major areas. They are the classic x-ray projection microscope, x-ray contact imag ing (microradiography) and the more recent x-ray scanning micro scope, x-ray photoelectron microscope and x-ray imaging microscope."

The combination of atomic force microscopy with ultrasonic methods allows the nearfield detection of acoustic signals. The nondestructive characterization and nanoscale quantitative mapping of surface adhesion and stiffness or friction is possible. The aim of this book is to provide a comprehensive review of different scanning probe acoustic techniques, including AFAM, UAFM, SNFUH, UFM, SMM and torsional tapping modes. Basic theoretical explanations are given to understand not only the probe dynamics but also the dynamics of tip surface contacts. Calibration and enhancement are discussed to better define the performance of the techniques, which are also compared with other classical techniques such as nanoindentation or surface acoustic wave. Different application fields are described, including biological surfaces, polymers and thin films.

This volume looks at the methodology and techniques used by experts to study how certain molecules function in specific locations, and their temporal patterns. Chapters in this book cover topics such as in vivo single-molecule tracking of voltage-gated calcium channels with split-fluorescent proteins in CRISPR-engineering C. elegans; protein-protein interactions in membranes using single particle tracking; neuropathological diseases revealed by quantum-dot single particle tracking; SPoD-OnSPAN; and investigating molecular diffusion inside small neuronal compartments with two-photon fluorescence correlation spectroscopy. In the Neuromethods series style, chapters include the kind of detail and key advice from the specialists needed to get successful results in your laboratory. Cutting-edge and comprehensive, Single Molecule Microscopy is a valuable resource for any researcher interested in learning more about this important field.

Successful transmission electron microscopy in all of its manifestations depends on the quality of the specimens examined. Biological specimen preparation protocols have usually been more rigorous and time consuming than those in the physical sciences. For this reason, there has been a wealth of scienti?c literature detailing speci?c preparation steps and numerous excellent books on the preparation of b- logical thin specimens. This does not mean to imply that physical science specimen preparation is trivial. For the most part, most physical science thin specimen pre- ration protocols can be executed in a matter of a few hours using straightforward steps. Over the years, there has been a steady stream of papers written on various aspects of preparing thin specimens from bulk materials. However, aside from s- eral seminal textbooks and a series of book compilations produced by the Material Research Society in the 1990s, no recent comprehensive books on thin spe- men preparation have appeared until this present work, ?rst in French and now in English. Everyone knows that the data needed to solve a problem quickly are more imp- tant than ever. A modern TEM laboratory with supporting SEMs, light microscopes, analytical spectrometers, computers, and specimen preparation equipment is an investment of several million US dollars. Fifty years ago, electropolishing, chemical polishing, and replication methods were the principal specimen preparation me- ods.

Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semi- conductor industry, nanotechnology and the biological, forensic, and medical sciences. This book provides an introduction to the theory and current practice of electron microscopy, aimed primarily at undergraduates who need to learn how the basic principles of physics are applied in an important area of science and technology that has contributed greatly to our knowledge of life processes and inner space. However, it will be equally valuable for technologists who make use of electron microscopes and for graduate students, university teachers and researchers who need a concise text that deals with the basic principles of microscopy. Less technical but broader in scope than other microscopy textbooks, Physical Principles of Electron Microscopy is appropriate for undergraduates and technologists with limited math...

Successful transmission electron microscopy in all of its manifestations depends on the quality of the specimens examined. Biological specimen preparation protocols have usually been more rigorous and time consuming than those in the physical sciences. For this reason, there has been a wealth of scienti c literature detailing speci c preparation steps and numerous excellent books on the preparation of b- logical thin specimens. This does not mean to imply that physical science specimen preparation is trivial. For the most part, most physical science thin specimen pre- ration protocols can be executed in a matter of a few hours using straightforward steps. Over the years, there has been a steady stream of papers written on various aspects of preparing thin specimens from bulk materials. However, aside from s- eral seminal textbooks and a series of book compilations produced by the Material Research Society in the 1990s, no recent comprehensive books on thin specimen preparation have appeared until this present work, rst in French and now in English. Everyone knows that the data needed to solve a problem quickly are more imp- tant than ever. A modern TEM laboratory with supporting SEMs, light microscopes, analytical spectrometers, computers, and specimen preparation equipment is an investment of several million US dollars. Fifty years ago, electropolishing, chemical polishing, and replication methods were the principal specimen preparation me- ods.

In modern scanning electron microscopy, sample surface preparation is of key importance, just as it is in transmission electron microscopy. With the procedures for sample surface preparation provided in the present book, the enormous potential of advanced scanning electron microscopes can be realized fully. This will take the reader to an entirely new level of scanning electron microscopy and finely-detailed images never seen before. Written for: Scientists, practitioners, academic libraries, graduate students

This guide provides extensive coverage of microscopic imaging principles. After reviewing the main principles of image formation, diffraction, interference, and polarization used in microscopy, this guide describes the most widely applied microscope configurations and applications. It also covers major system components, including light sources, illumination layouts, microscope optics, and image detection electronics. This guide also provides a comprehensive overview of microscopy techniques, including bright field and dark field imaging, contrast enhancement methods (such as phase and amplitude contrast), DIC, polarization, and fluorescence microscopy. In addition, it describes scanning techniques (such as confocal and multiphoton imaging points); new trends in super-resolution methods (such as 4Pi microscopy, STED, STORM, and structured illumination); and, array microscopy, CARS, and SPIM.

Bioimaging in life sciences is a burgeoning area that is of growing interest to today's professionals and researchers in the field. This is the first book that bridges the gap between biomedical imaging and the bioscience community. This unique resource gives professionals a detailed understanding of imaging platforms, fluorescence imaging, and fundamental image processing algorithms. Further, it guides readers through the application of advanced image analysis methods and techniques to specific biological problems. The book presents applications that span a wide range of scales, from the detection of signaling events in sub-cellular structures, to the automated analysis of tissue structures. Other critical areas discussed include the dynamics of cell populations and in vivo microscopy. A DVD is also included. It contains full-color images, movies and other valuable supplementary material that further illustrate topics discussed in the book.

This is the first book to bring together both the basic theory and proven process engineering practice of AFM. It is presented in a way that is accessible and valuable to practising engineers as well as to those who are improving their AFM skills and knowledge, and to researchers who are developing new products and solutions using AFM.

The book takes a rigorous and practical approach that ensures it is directly applicable to process engineering problems. Fundamentals and techniques are concisely described, while specific benefits for process engineering are clearly defined and illustrated. Key content includes: particle-particle, and particle-bubble interactions; characterization of membrane surfaces; the development of fouling resistant membranes; nanoscale pharmaceutical analysis; nanoengineering for cellular sensing; polymers on surfaces; micro and nanoscale rheometry.
Atomic force microscopy (AFM) is an important tool for process engineers and scientists as it enables improved processes and productsThe only book dealing with the theory and practical applications of atomic force microscopy in process engineeringProvides best-practice guidance and experience on using AFM for process and product improvement

This volume contains invited and contributed papers presented at the conference on 'Microscopy of Semiconducting Materials' held at the University of Cambridge on 2-5 April 2007. The event was organised under the auspices of the Electron Microscopy and Analysis Group of the Institute of Physics, the Royal Microscopical Society and the Materials Research Society. This international conference was the fifteenth in the series that focuses on the most recent world-wide advances in semiconductor studies carried out by all forms of microscopy and it attracted delegates from more than 20 countries. With the relentless evolution of advanced electronic devices into ever smaller nanoscale structures, the problem relating to the means by which device features can be visualised on this scale becomes more acute. This applies not only to the imaging of the general form of layers that may be present but also to the determination of composition and doping variations that are employed. In view of this scenario, the vital importance of transmission and scanning electron microscopy, together with X-ray and scanning probe approaches can immediately be seen. The conference featured developments in high resolution microscopy and nanoanalysis, including the exploitation of recently introduced aberration-corrected electron microscopes. All associated imaging and analytical techniques were demonstrated in studies including those of self-organised and quantum domain structures. Many analytical techniques based upon scanning probe microscopies were also much in evidence, together with more general applications of X-ray diffraction methods.

The study of polymers by electron microscopy (EM) needs special techniques, precautions and preparation methods, including ultramicrotomy. General characteristics of the different techniques of EM, including scanning force microscopy, are given in this hands-on book. The application of these techniques to the study of morphology and properties, particularly micromechanical properties, is described in detail. Examples from all classes of polymers are presented.

In 1987, Barry Lynes wrote the classic book on Rife history called The Cancer Cure That Worked. Rife's World of Electromedicine is the sequel, published in 2009. What is the difference between the two books? The Cancer Cure That Worked was primarily a biographical account of Royal Raymond Rife's life and work, including detailed, dated records of the events which occurred, and in-depth accounts from the people involved. Rife's World of Electromedicine, on the other hand, is a bird's eye view, short summary of the same time period and events. Instead of a detailed biography, Rife's World is an expository piece that includes brief, targeted chapters addressing each aspect of Rife's era, utilizing piercing, specific, and direct quotes and excerpts from historical documents including magazine and newspaper articles, court transcripts, Rife's own statements, and the eye-witness accounts of those who were present during Rife's lifelong achievements. Written as a short story, Rife's World is affordably priced so that everyone can read about Royal Raymond Rife. The book is a perfect gift for someone who wants to find out more about Rife but doesn't have time to read a longer book. Additionally, the new book explains what 20] years of additional research and document retrieval by a dedicated grass roots group have discovered and unearthed. Some of the previously missing, key factors in the suppressed and censored cure for cancer were lost or even locked away in physicians' closets for decades in order to prevent censors from destroying overwhelming evidence. Now, this evidence is printed for the first time in Rife's World.

Polymer Microscopy, 3rd Edition, is a comprehensive and practical guide to the study of the microstructure of polymers, and is the result of the authors' many years of academic and industrial experience. To address the needs of students and professionals from a variety of backgrounds, introductory chapters deal with the basic concepts of both polymer morphology and processing and microscopy and imaging theory. The core of the book is more applied, with many examples of specimen preparation and image interpretation leading to materials characterization.Microscopy is applied to the characterization of a wide range of polymer systems, including fibers, films, engineering resins and plastics, composites, nanocomposites, polymer blends, emulsions and liquid crystaline polymers. Light microscopy, atomic force microscopy, scanning and transmission electron microscopy techniques are all considered, as are emerging techniques such as compositional mapping in which microscopy is combined with spectroscopy. This extensively updated and revised third edition closes with a problem solving guide, which gives a systematic framework for deciding on suitable approaches to the characterization of

The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. This is the first book to summarize the state-of-the-art of this technique. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely and comprehensive overview of SPM applications.

AN INTRODUCTION TO The Theory and Use of the Microscope BY C. R. MARSHALL, M. A., M. D., LL. D. Professor of Materia Medico, and Therapeutics in the University of Aberdeen. AND H. D. GRIFFITH, B. A. Carnegie Teaching Fellow in Natural Philosophy in the University of Aberdeen. WITH TWENTY-NINE FIGURES IN THE TEXT AND THREE PLATES LONDON GEORGE ROUTLEDGE SONS, LTD. BROADWAY HOUSE 68-74 CARTER LANE, E. G. PRINTED IN GREAT BRITUN BY W. JOLLY AND SONS, LTD., ABERDEEN. FOREWORD. THE inspiration of this brochure was the institution of lectures and practical work on Microscopy as part of the class of Medical Physics in the University of Aberdeen. It was felt that a small textbook covering the work of the systematic lectures would be helpful . to the student and might aid him to realize the capabilities, limitations and proper method of use of the instrument. A chapter on the elementary mathematical treat ment of certain problems discussed in the text has been added. It is hoped that the work will prove of value to all students who require a microscope in their studies as well as to those amateur microscopists who wish to understand the fundamental principles on which Microscopy is based. C. R. M. H. D. G. January, 1928. CONTENTS. PAGE. INTRODUCTION i 10 The Simple Convex Lens Formation of the Image The Influence of the Eye Visibility of Objects The Simple Microscope The Compound Microscope. THE LENSES OF THE MICROSCOPE . . . n 32 Chromatic Aberration Spherical Aberration. OBJECTIVES. Achromatic, Semi-apochromatic, Apochromatic Focal Length Numerical Aperture Depth of Focus Working Distance Flatness of Field. EYEPIECES. Huyghenian Positive-Ramsden Disc Magnifying Power. CONDENSERS. AbbeAchromatic - Critical Illumination Focal Length Dark Ground Condensers Ultra Microscopy. RESOLUTION 33 36 Limit of Microscopic Vision Ultra-Violet Microscopy Abbes Diffraction Theory. THE STAND 37 44 The Foot The Stage The Substage The Body The Nose Piece The Limb Choice of Stand Choice of Objectives Choice of Eyepieces Testing Objectives. ILLUMINANTS 45 49 Illumination of Transparent Objects Dark Ground Effects Oblique Illumination Illu ination of Opaque Objects, vili. CONTENTS ADJUSTMENT 50 56 Adjustment of Mirror Focusing of Condenser Centering of Condenser Adjustment of Iris Diaphragm Adjustment of Tube Length Changing Objectives Changing Eyepieces Care of the Microscope., MlCROMETRY 57 62 Stage and Eyepiece Micrometers Photo-Micrography Measurement of Magnification Drawing Eyepieces Measurement of Thick ness. SPECTROSCOPY . ... 6364 SPECIAL MICROSCOPES ...... 65 72 The Metallurgical Microscope The Petro logical Microscope. Binocular Microscopes Greenough Wenham, Compound Prism Abbes Stereoscopic Eye piece Binocular Vision Binocular Rivalry. PHYSICAL PROOFS 73 84 Magnification Numerical Aperture Depth of Focus Ramsden Circle Chromatic Correction Sine Condition and Aplanatism Resolution. INDEX, 85 90 PLATES to face pp. 6, 28, 36 AN INTRODUCTION TO THE THEORY AND USE OF THE MICROSCOPE. THE function of the microscope is to reveal detail of the structure of objects too small to be visible to the unaided eye. This end is attained by the use of a series of lenses which make the object appear magnified to the observer. The magnification to be of value must extend to the finest detail of the object and each successive stage of magnification should reveal structure invisible without its aid.So-called c resolution J of detail in an object does not of necessity result from mere optical magnification. Magnification is necessary to attain it, but other factors are involved. It is the aim of this brochure to explain the principles of microscopy and the manipulations by which resolution is obtained. For these purposes it is essential to consider first certain properties of the simple convex lens, and some of the conditions governing the visibility of objects. THE SIMPLE CONVEX LENS...