Books > Science & Mathematics > Physics > States of matter > Condensed matter physics (liquids & solids)
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Transmission Electron Microscopy and Diffractometry of Materials (Paperback, 4th ed. 2013)
Loot Price: R2,851
Discovery Miles 28 510
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Transmission Electron Microscopy and Diffractometry of Materials (Paperback, 4th ed. 2013)
Series: Graduate Texts in Physics
Expected to ship within 10 - 15 working days
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This book explains concepts of transmission electron microscopy
(TEM) and x-ray diffractometry (XRD) that are important for the
characterization of materials. The fourth edition adds important
new techniques of TEM such as electron tomography, nanobeam
diffraction, and geometric phase analysis. A new chapter on neutron
scattering completes the trio of x-ray, electron and neutron
diffraction. All chapters were updated and revised for clarity. The
book explains the fundamentals of how waves and wavefunctions
interact with atoms in solids, and the similarities and differences
of using x-rays, electrons, or neutrons for diffraction
measurements. Diffraction effects of crystalline order, defects,
and disorder in materials are explained in detail. Both practical
and theoretical issues are covered. The book can be used in an
introductory-level or advanced-level course, since sections are
identified by difficulty. Each chapter includes a set of problems
to illustrate principles, and the extensive Appendix includes
laboratory exercises.
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