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Books > Science & Mathematics > Physics > Particle & high-energy physics

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High-Resolution Imaging and Spectrometry of Materials (Hardcover, 2003 ed.) Loot Price: R4,443

Discovery Miles 44 430

Repayment Terms: R416 pm x 12*

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High-Resolution Imaging and Spectrometry of Materials (Hardcover, 2003 ed.): Frank Ernst, Manfred Ruhle

High-Resolution Imaging and Spectrometry of Materials (Hardcover, 2003 ed.)

Frank Ernst, Manfred Ruhle

Series: Springer Series in Materials Science, 50

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Loot Price R4,443 Discovery Miles 44 430 | Repayment Terms: R416 pm x 12*

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This book gives a survey of, and systematic introduction to, high-resolution electron microscopy. The method is thoroughly discussed; the latest developments are reported; and applications to surface and interface analysis and to the study of hidden structures are detailed. The book arises from research carried out at one of the world's leading centers of electron microscopy. It will appeal to researchers and advanced students.

General

Imprint:	Springer-Verlag
Country of origin:	Germany
Series:	Springer Series in Materials Science, 50
Release date:	2003
First published:	2003
Editors:	Frank Ernst • Manfred Ruhle
Dimensions:	235 x 155 x 41mm (L x W x T)
Format:	Hardcover
Pages:	442
Edition:	2003 ed.
ISBN-13:	978-3-540-41818-4
Categories:	Books > Science & Mathematics > Physics > Particle & high-energy physics Books > Professional & Technical > Mechanical engineering & materials > Materials science > General Books > Science & Mathematics > Chemistry > Analytical chemistry > Qualitative analytical chemistry > Chemical spectroscopy, spectrochemistry > General Promotions
LSN:	3-540-41818-0
Barcode:	9783540418184