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Books > Science & Mathematics > Physics > Particle & high-energy physics

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High-Resolution Imaging and Spectrometry of Materials (Hardcover, 2003 ed.) Loot Price: R4,294
Discovery Miles 42 940
High-Resolution Imaging and Spectrometry of Materials (Hardcover, 2003 ed.): Frank Ernst, Manfred Ruhle

High-Resolution Imaging and Spectrometry of Materials (Hardcover, 2003 ed.)

Frank Ernst, Manfred Ruhle

Series: Springer Series in Materials Science, 50

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Loot Price R4,294 Discovery Miles 42 940 | Repayment Terms: R402 pm x 12*

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This book gives a survey of, and systematic introduction to, high-resolution electron microscopy. The method is thoroughly discussed; the latest developments are reported; and applications to surface and interface analysis and to the study of hidden structures are detailed. The book arises from research carried out at one of the world's leading centers of electron microscopy. It will appeal to researchers and advanced students.

General

Imprint: Springer-Verlag
Country of origin: Germany
Series: Springer Series in Materials Science, 50
Release date: December 2002
First published: 2003
Editors: Frank Ernst • Manfred Ruhle
Dimensions: 235 x 155 x 41mm (L x W x T)
Format: Hardcover
Pages: 442
Edition: 2003 ed.
ISBN-13: 978-3-540-41818-4
Categories: Books > Science & Mathematics > Physics > Particle & high-energy physics
Books > Professional & Technical > Mechanical engineering & materials > Materials science > General
Books > Science & Mathematics > Chemistry > Analytical chemistry > Qualitative analytical chemistry > Chemical spectroscopy, spectrochemistry > General
LSN: 3-540-41818-0
Barcode: 9783540418184

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