Spectroscopic ellipsometry has been applied to a wide variety of
material and device characterizations in solar cell research
fields. In particular, device performance analyses using exact
optical constants of component layers and direct analyses of
complex solar cell structures are unique features of advanced
ellipsometry methods. This second volume of Spectroscopic
Ellipsometry for Photovoltaics presents various applications of the
ellipsometry technique for device analyses, including
optical/recombination loss analyses, real-time control and on-line
monitoring of solar cell structures, and large-area structural
mapping. Furthermore, this book describes the optical constants of
148 solar cell component layers, covering a broad range of
materials from semiconductor light absorbers (inorganic, organic
and hybrid perovskite semiconductors) to transparent conductive
oxides and metals. The tabulated and completely parameterized
optical constants described in this book are the most current
resource that is vital for device simulations and solar cell
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