This new fourth edition of the standard text on atomic-resolution
transmission electron microscopy (TEM) retains previous material on
the fundamentals of electron optics and aberration correction,
linear imaging theory (including wave aberrations to fifth order)
with partial coherence, and multiple-scattering theory. Also
preserved are updated earlier sections on practical methods, with
detailed step-by-step accounts of the procedures needed to obtain
the highest quality images of atoms and molecules using a modern
TEM or STEM electron microscope. Applications sections have been
updated - these include the semiconductor industry, superconductor
research, solid state chemistry and nanoscience, and metallurgy,
mineralogy, condensed matter physics, materials science and
material on cryo-electron microscopy for structural biology. New or
expanded sections have been added on electron holography,
aberration correction, field-emission guns, imaging filters,
super-resolution methods, Ptychography, Ronchigrams, tomography,
image quantification and simulation, radiation damage, the
measurement of electron-optical parameters, and detectors (CCD
cameras, Image plates and direct-injection solid state detectors).
The theory of Scanning transmission electron microscopy (STEM) and
Z-contrast are treated comprehensively. Chapters are devoted to
associated techniques, such as energy-loss spectroscopy, Alchemi,
nanodiffraction, environmental TEM, twisty beams for magnetic
imaging, and cathodoluminescence. Sources of software for image
interpretation and electron-optical design are given.
General
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