Field Emission Scanning Electron Microscopy - New Perspectives for Materials Characterization (Paperback, 1st ed. 2018)

This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage

General

Imprint:	Springer Verlag, Singapore
Country of origin:	Singapore
Series:	SpringerBriefs in Applied Sciences and Technology
Release date:	October 2017
First published:	2018
Authors:	Nicolas Brodusch • Hendrix DeMers • Raynald Gauvin
Dimensions:	235 x 155 x 13mm (L x W x T)
Format:	Paperback
Pages:	137
Edition:	1st ed. 2018
ISBN-13:	978-981-10-4432-8
Categories:	Books > Professional & Technical > Industrial chemistry & manufacturing technologies > Other manufacturing technologies > Precision instruments manufacture > General Books > Professional & Technical > Mechanical engineering & materials > Materials science > Testing of materials > General Books > Science & Mathematics > Chemistry > Analytical chemistry > Qualitative analytical chemistry > Chemical spectroscopy, spectrochemistry > General
LSN:	981-10-4432-5
Barcode:	9789811044328

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