Optical Characterization of Thin Solid Films (Hardcover, 1st ed. 2018)

This book is an up-to-date survey of the major optical characterization techniques for thin solid films. Emphasis is placed on practicability of the various approaches. Relevant fundamentals are briefly reviewed before demonstrating the application of these techniques to practically relevant research and development topics. The book is written by international top experts, all of whom are involved in industrial research and development projects.

General

Imprint:	Springer International Publishing AG
Country of origin:	Switzerland
Series:	Springer Series in Surface Sciences, 64
Release date:	March 2018
First published:	2018
Editors:	Olaf Stenzel • Miloslav Ohlidal
Dimensions:	235 x 155 x 35mm (L x W x T)
Format:	Hardcover
Pages:	462
Edition:	1st ed. 2018
ISBN-13:	978-3-319-75324-9
Categories:	Books > Science & Mathematics > Physics > States of matter > Condensed matter physics (liquids & solids) Books > Professional & Technical > Mechanical engineering & materials > Materials science > General Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Electronic devices & materials > General Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Applied optics > General Books > Science & Mathematics > Chemistry > Analytical chemistry > Qualitative analytical chemistry > Chemical spectroscopy, spectrochemistry > General
LSN:	3-319-75324-X
Barcode:	9783319753249

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