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Books > Science & Mathematics > Physics > States of matter > Condensed matter physics (liquids & solids)

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Reflection High-Energy Electron Diffraction and Reflection Electron Imaging of Surfaces (Paperback, Softcover reprint of the original 1st ed. 1988) Loot Price: R3,129
Discovery Miles 31 290
Reflection High-Energy Electron Diffraction and Reflection Electron Imaging of Surfaces (Paperback, Softcover reprint of the...

Reflection High-Energy Electron Diffraction and Reflection Electron Imaging of Surfaces (Paperback, Softcover reprint of the original 1st ed. 1988)

P.K. Larsen, P.J. Dobson

Series: NATO Science Series B:, 188

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Loot Price R3,129 Discovery Miles 31 290 | Repayment Terms: R293 pm x 12*

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This volume contains the papers presented at the NATO Advanced Research Workshop in "Reflection High Energy Electron Diffraction and Reflection Electron Imaging of Surfaces" held at the Koningshof conference center, Veldhoven, the Netherlands, June 15-19, 1987. The main topics of the workshop, Reflection High Energy Electron Diffraction (RHEED) and Reflection Electron Microscopy (REM), have a common basis in the diffraction processes which high energy electrons undergo when they interact with solid surfaces at grazing angles. However, while REM is a new technique developed on the basis of recent advances in transmission electron microscopy, RHEED is an old method in surface crystallography going back to the discovery of electron diffraction in 1927 by Davisson and Germer. Until the development of ultra high vacuum techniques in the 1960's made instruments using slow electrons more accessable, RHEED was the dominating electron diffraction technique. Since then and until recently the method of Low Energy Electron Diffraction (LEED) largely surpassed RHEED in popularity in surface studies. The two methods are closely related of course, each with its own specific advantages. The grazing angle geometry of RHEED has now become a very useful feature because this makes it ideally suited for combination with the thin growth technique of Molecular Beam Epitaxy (MBE). This combination allows in-situ studies of freshly grown and even growing surfaces, opening up new areas of research of both fundamental and technological importance.

General

Imprint: Springer-Verlag New York
Country of origin: United States
Series: NATO Science Series B:, 188
Release date: February 2012
First published: 1988
Editors: P.K. Larsen • P.J. Dobson
Dimensions: 254 x 178 x 28mm (L x W x T)
Format: Paperback
Pages: 556
Edition: Softcover reprint of the original 1st ed. 1988
ISBN-13: 978-1-4684-5582-3
Categories: Books > Science & Mathematics > Physics > States of matter > Condensed matter physics (liquids & solids)
Books > Professional & Technical > Mechanical engineering & materials > Materials science > Testing of materials > General
Books > Science & Mathematics > Chemistry > Analytical chemistry > Qualitative analytical chemistry > Chemical spectroscopy, spectrochemistry > General
LSN: 1-4684-5582-6
Barcode: 9781468455823

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