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Electron Energy-Loss Spectroscopy in the Electron Microscope (Paperback, 3rd ed. 2011)
Loot Price: R9,327
Discovery Miles 93 270
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Electron Energy-Loss Spectroscopy in the Electron Microscope (Paperback, 3rd ed. 2011)
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Within the last 30 years, electron energy-loss spectroscopy (EELS)
has become a standard analytical technique used in the transmission
electron microscope to extract chemical and structural information
down to the atomic level. In two previous editions, Electron
Energy-Loss Spectroscopy in the Electron Microscope has become the
standard reference guide to the instrumentation, physics and
procedures involved, and the kind of results obtainable. Within the
last few years, the commercial availability of lens-aberration
correctors and electron-beam monochromators has further increased
the spatial and energy resolution of EELS. This thoroughly updated
and revised Third Edition incorporates these new developments, as
well as advances in electron-scattering theory, spectral and image
processing, and recent applications in fields such as
nanotechnology. The appendices now contain a listing of inelastic
mean free paths and a description of more than 20 MATLAB programs
for calculating EELS data.
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