Physical Principles of Electron Microscopy - An Introduction to TEM, SEM, and AEM (Paperback, Softcover reprint of the original 2nd ed. 2016)

Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.

General

Imprint:	Springer International Publishing AG
Country of origin:	Switzerland
Release date:	May 2018
Authors:	R.F. Egerton
Dimensions:	235 x 155 x 16mm (L x W x T)
Format:	Paperback
Pages:	196
Edition:	Softcover reprint of the original 2nd ed. 2016
ISBN-13:	978-3-319-81986-0
Categories:	Books > Science & Mathematics > Biology, life sciences > General Books > Professional & Technical > Technology: general issues > Nanotechnology Books > Professional & Technical > Mechanical engineering & materials > Materials science > Testing of materials > General Books > Science & Mathematics > Chemistry > Analytical chemistry > Qualitative analytical chemistry > Chemical spectroscopy, spectrochemistry > General
LSN:	3-319-81986-0
Barcode:	9783319819860

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