This thesis presents the first direct observations of the 3D-shape,
size and electrical properties of nanoscale filaments, made
possible by a new Scanning Probe Microscopy-based tomography
technique referred to as scalpel SPM. Using this innovative
technology and nm-scale observations, the author achieves essential
insights into the filament formation mechanisms, improves the
understanding required for device optimization, and experimentally
observes phenomena that had previously been only theoretically
proposed.
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