An increasing number of system designers are using ASIP 's rather than ASIC 's to implement their system solutions. Building ASIPs: The Mescal Methodology gives a simple but comprehensive methodology for the design of these application-specific instruction processors (ASIPs).

The key elements of this methodology are:

Judiciously using benchmarking

Inclusively identifying the architectural space

Efficiently describing and evaluating the ASIPs

Comprehensively exploring the design space

Successfully deploying the ASIP

This book includes demonstrations of applications of the methodologies using the Tipi research framework as well as state-of-the-art commercial toolsets from CoWare and Tensilica.

This monograph solely investigates the Debye Screening Length (DSL) in semiconductors and their nano-structures. The materials considered are quantized structures of non-linear optical, III-V, II-VI, Ge, Te, Platinum Antimonide, stressed materials, Bismuth, GaP, Gallium Antimonide, II-V and Bismuth Telluride respectively. The DSL in opto-electronic materials and their quantum confined counterparts is studied in the presence of strong light waves and intense electric fields on the basis of newly formulated electron dispersion laws that control the studies of such quantum effect devices. The suggestions for the experimental determination of 2D and 3D DSL and the importance of measurement of band gap in optoelectronic materials under intense built-in electric field in nano devices and strong external photo excitation (for measuring photon induced physical properties) have also been discussed in this context. The influence of crossed electric and quantizing magnetic fields on the DSL and the DSL in heavily doped semiconductors and their nanostructures has been investigated. This monograph contains 150 open research problems which form the integral part of the text and are useful for both PhD students and researchers in the fields of solid-state sciences, materials science, nano-science and technology and allied fields in addition to the graduate courses in modern semiconductor nanostructures.

Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, resources and costs associated with test development, manufacture cost and lifecycle maintenance of their products can be significantly reduced by designing embedded test in the product. A complete design flow and analysis of the impact of embedded test on a design makes this book a must read' before any DFT is attempted.

GaAs devices and integrated circuits have emerged as leading contenders for ultra-high-speed applications. This book is intended to be a reference for a rapidly growing GaAs community of researchers and graduate students. It was written over several years and parts of it were used for courses on GaAs devices and integrated circuits and on heterojunction GaAs devices developed and taught at the University of Minnesota. Many people helped me in writing this book. I would like to express my deep gratitude to Professor Lester Eastman of Cornell University, whose ideas and thoughts inspired me and helped to determine the direction of my research work for many years. I also benefited from numerous discussions with his students and associates and from the very atmosphere of the pursuit of excellence which exists in his group. I would like to thank my former and present co-workers and colleagues-Drs. Levinstein and Gelmont of the A. F. Ioffe Institute of Physics and Technology, Professor Melvin Shaw of Wayne State University, Dr. Kastalsky of Bell Communi cations, Professor Gary Robinson of Colorado State University, Professor Tony Valois, and Dr. Tim Drummond of Sandia Labs-for their contributions to our joint research and for valuable discussions. My special thanks to Professor Morko.;, for his help, his ideas, and the example set by his pioneering work. Since 1978 I have been working with engineers from Honeywell, Inc.-Drs.

A totally new concept for clean surface processing of Si wafers is introduced in this book. Some fifty distinguished researchers and engineers from the leading Japanese semiconductor companies, such as NEC, Hitachi, Toshiba, Sony and Panasonic as well as from several universities reveal to us for the first time the secrets of these highly productive institutions. They describe the techniques and equipment necessary for the preparation of clean high-quality semiconductor surfaces as a first step in high-yield/high-quality device production. This book thus opens the door to the manufacturing of reliable nanoscale devices and will be extremely useful for every engineer, physicist and technician involved in the production of silicon semiconductor devices.

Semiconductor power electronics plays a dominant role due its increased efficiency and high reliability in various domains including the medium and high electrical drives, automotive and aircraft applications, electrical power conversion, etc. Power/HVMOS Devices Compact Modeling will cover very extensive range of topics related to the development and characterization power/high voltage (HV) semiconductor technologies as well as modeling and simulations of the power/HV devices and smart power integrated circuits (ICs). Emphasis is placed on the practical applications of the advanced semiconductor technologies and the device level compact/spice modeling. This book is intended to provide reference information by selected, leading authorities in their domain of expertise. They are representing both academia and industry. All of them have been chosen because of their intimate knowledge of their subjects as well as their ability to present them in an easily understandable manner.

This monograph is intended for scientists and TCAD engineers who are interested in physics-based simulation of Si and SiGe devices. The common theoretical background of the drift-diffusion, hydrodynamic, and Monte-Carlo models and their synergy are discussed and it is shown how these models form a consistent hierarchy of simulation tools. The basis of this hierarchy is the full-band Monte-Carlo device model which is discussed in detail, including its numerical and stochastic properties. The drift-diffusion and hydrodynamic models for large-signal, small-signal, and noise analysis are derived from the Boltzmann transport equation in such a way that all transport and noise parameters can be obtained by Monte-Carlo simulations. With this hierarchy of simulation tools the device characteristics of strained Si MOSFETs and SiGe HBTs are analysed and the accuracy of the momentum-based models is assessed by comparison with the Monte-Carlo device simulator.

The rapid evolution and explosive growth of integrated circuit technology have impacted society more than any other technological development of the 20th century. Integrated circuits (ICs) are used universally and the expanding use of IC technology requires more accurate circuit analysis methods and tools, prompting the introduction of computers into the design process. The goal of this book is to build a firm foundation in the use of computer-assisted techniques for IC device and process design. Both practical and analytical viewpoints are stressed to give the reader the background necessary to appreciate CAD tools and to feel comfortable with their use. Technology CAD - Computer Simulation of IC Processes and Devices presents a unified discourse on process and device CAD as interrelated subjects, building on a wide range of experiences and applications of the SUPREM program. Chapter 1 focuses on the motivation for coupled process and device CAD. In Chapter 2 SUPREM III is introduced, and process CAD is discussed in terms of ion-implantation, impurity diffusion, and oxidation models. Chapter 3 introduces the Stanford device analysis program SEDAN III (SEmiconductor Device ANalysis). The next three chapters move into greater detail concerning device operating principles and analysis techniques. Chapter 4 reviews the classical formulation of pn junction theory and uses device analysis (SEDAN) both to evaluate some of the classical assumptions and to investigate the difficult problem of high level injection. Chapter 5 returns to MOS devices, reviews the first-order MOS theory, and introduces some important second-order effects. Chapter 6 considers the bipolar transistor. Chapter 7considers the application of process simulation and device analysis to technology design. The BiCMOS process is selected as a useful design vehicle for two reasons. First, it allows the reader to pull together concepts from the entire book. Second, the inherent nature of BiCMOS technology offers real constraints and hence trade-offs which must be understood and accounted for.

System Test and Diagnosis is the first book on test and diagnosis at the system level, defined as any aggregation of related elements that together form an entity of sufficient complexity for which it is impractical to treat all of the elements at the lowest level of detail. The ideas presented emphasize that it is possible to diagnose complex systems efficiently. Since the notion of system is hierarchical, these ideas are applicable to all levels. The philosophy is presented in the context of a model-based approach, using the information flow model, that focuses on the information provided by the tests rather than the functions embedded in the system. Detailed algorithms are offered for evaluating system testability, performing efficient diagnosis, verifying and validating the models, and constructing an architecture for system maintenance. Several advanced algorithms, not commonly available in existing diagnosis tools, are discussed, including reasoning with inexact or uncertain test data, breaking large problems into manageable smaller problems, diagnosing systems with time sensitive information and time dependent tests and learning from experience. The book is divided into three parts. The first part provides motivation for careful development of the subject and the second part provides the tools necessary for analyzing system testability and computing diagnostic strategies. The third part presents advanced topics in diagnosis. Several case studies are provided, including a single detailed case study. Smaller case studies describe experiences from actual applications of the methods discussed. The detailed case study walks the reader through a complete analysis of a system to illustrate the concepts and describe the analyses that are possible. All case studies are based upon real systems that have been modeled for the purposes of diagnosis. System Test and Diagnosis is the culmination of nearly twelve years of research into diagnosis modeling and its applications. It is designed as a primary reference for engineers and practitioners interested in system test and diagnosis.

Branch-and-bound search has been known for a long time and has been widely used in solving a variety of problems in computer-aided design (CAD) and many important optimization problems. In many applications, the classic branch-and-bound search methods perform duplications of computations, or rely on the search decision trees which keep track of the branch-and-bound search processes. In CAD and many other technical fields, the computational cost of constructing branch-and-bound search decision trees in solving large scale problems is prohibitive and duplications of computations are intolerable. Efficient branch-and-bound methods are needed to deal with today's computational challenges. Efficient branch-and-bound methods must not duplicate computations. Efficient Branch and Bound Search with Application to Computer-Aided Design describes an efficient branch-and-bound method for logic justification, which is fundamental to automatic test pattern generation (ATPG), redundancy identification, logic synthesis, minimization, verification, and other problems in CAD. The method is called justification equivalence, based on the observation that justification processes may share identical subsequent search decision sequences. With justification equivalence, duplication of computations is avoided in the dynamic branch-and-bound search process without using search decision trees. Efficient Branch and Bound Search with Application to Computer-Aided Design consists of two parts. The first part, containing the first three chapters, provides the theoretical work. The second part deals with applications, particularly ATPG for sequential circuits. This book is particularly useful to readers who are interested in the design and test of digital circuits.

Gallium Arsenide technology has come of age. GaAs integrated circuits are available today as gate arrays with an operating speed in excess of one Gigabits per second. Special purpose GaAs circuits are used in optical fiber digital communications systems for the purpose of regeneration, multiplexing and switching of the optical signals. As advances in fabrication and packaging techniques are made, the operat ing speed will further increase and the cost of production will reach a point where large scale application of GaAs circuits will be economical in these and other systems where speed is paramount. This book is written for students and engineers who wish to enter into this new field of electronics for the first time and who wish to embark on a serious study of the subject of GaAs circuit design. No prior knowledge of GaAs technology is assumed though some previous experience with MOS circuit design will be helpful. A good part of the book is devoted to circuit analysis, to the extent that is possible for non linear circuits. The circuit model of the GaAs transistor is derived from first principles and analytic formulas useful in predicting the approxi mate circuit performance are also derived. Computer simulation is used throughout the book to show the expected performance and to study the effects of parameter variations."

The great interest in photonic crystals and their applications in the last 15 years is being expressed in the publishing of a large number of monographs, collections, textbooks and tutorials, where existing knowledge concerning - eration principles of photonic crystal devices and microstructured ?bers, their mathematicaldescription,well-knownandnovelapplicationsofsuchtechno- gies in photonics and optical communications are presented. They challenges authors of new books to cover the gaps still existing in the literature and highlight and popularize of already known material in a new and original manner. Authorsofthisbookbelievethatthenextsteptowardswideapplicationof photoniccrystalsisthesolutionofmanypracticalproblemsofdesignandc- putation of the speci?c photonic crystal-based devices aimed at the speci?c technicalapplication.Inordertomakethisstep,itisnecessarytoincreasethe number of practitioners who can solve such problems independently. The aim of this book is to extend the group of researchers, developers and students, who could practically use the knowledge on the physics of photonic crystals together with the knowledge and skills of independent calculation of basic characteristics of photonic crystals and modeling of various elements of - tegrated circuits and optical communication systems created on the basis of photonic crystals. The book is intended for quali?ed readers, specialists in the ?eld of optics and photonics, students of higher courses, master degree students and PhD students. As an introduction to the snopest, the book contains the basics of wave optics and radiation propagation in simple guiding media such as planar waveguides and step-index ?bers.

This thesis describes a new approach to the construction of "solar cells." Following nature's example, this approach has the goal to find a biomimetic self-assembling dye, whose aggregates can mimic the natural light-harvesting system of special photosynthetic active bacteria. The thesis investigates methods to control the self-assembly such that suitable dye aggregates are formed with high internal order and size-confinement. The dye aggregates can be implemented into a new type of "solar cells," designed to combine the advantages of "hybrid solar cells" and "solid-state dye-sensitized solar cells" (ss-DSSCs): dye aggregate solar cells (DASCs). This book describes the construction and first tests of a prototype for DASCs on the basis of the investigated dye aggregates. The described approach has the advantage that it will enable to build up a light-harvesting system fully synthetically in large scale in order to realize low-cost, light-weight and environmentally friendly solar cells - a worthwhile goal towards the exploitation of clean energy from sunlight.

This book describes intuitive analog design approaches using digital inverters, providing filter architectures and circuit techniques enabling high performance analog circuit design. The authors provide process, supply voltage and temperature (PVT) variation-tolerant design techniques for inverter based circuits. They also discuss various analog design techniques for lower technology nodes and lower power supply, which can be used for designing high performance systems-on-chip.

This book discusses the effects, modeling, latest results, and nanotechnology applications of rainbows that appear during channeling of charged particles in crystals and nanotubes. The authors begin with a brief review of the optical and particle rainbow effects followed by a detailed description of crystal rainbows, which appear in ion channeling in crystals, and their modeling using catastrophe theory. The effects of spatial and angular focusing of channeled ions are described, with special attention given to the applications of the former effect to subatomic microscopy. The results of a thorough study of the recent high-resolution channeling experiments performed with protons of energies between 2.0 and 0.7 MeV and a 55 nm thick silicon crystal are also provided. This study opens up the potential for accurate analysis of very thin crystals. Also presented are recent results related to rainbows occurring in proton transmission through carbon nanotubes, and a detailed quantum consideration of the transmission of positrons of an energy of 1 MeV through very short carbon nanotubes. This process is determined by the rainbow effect. The initial positron beam is represented as an ensemble of non-interacting Gaussian wave packets, and the principal and supernumerary primary rainbows appearing in the spatial and angular distributions of transmitted positrons are clearly identified. They are explained by the effects of wrinkling, concentration and coordination of the wave packets.

Silicon technology has developed along virtually one single line: reducing the minimal size of lithographic features. But has this taken us to the point of diminishing returns? Are we now at a turning point in the logical evolution of microelectronics? Some believe that the semiconductor microelectronics industry has matured: the research game is over (comparisons with the steel industry are being made). Others believe that qualitative progress in hardware technology will come roaring back, based on innovative research. This debate, spirited as it is, is reflected in the pages of Future Trends in Microelectronics, where such questions are discussed. What kind of research does the silicon industry need to continue its expansion? What is the technical limit to shrinking Si devices? Is there any economic sense in pursuing this limit? What are the most attractive applications of optoelectronic hybrid systems? Are there any green pastures beyond the traditional semiconductor technologies? Identifying the scenario for the future evolution of microelectronics will present a tremendous opportunity for constructive action today.

An important real-world look at the status and future of integrated passives

This book provides an overview of the technology, potential applications, motivations, and problems associated with integrating resistors, capacitors, and inductors into circuit boards instead of mounting them as discrete components on the surface. Written primarily for engineers and scientists in industry who want to determine if passive integration is a viable option for a particular product, the text describes the processes available for designing and fabricating integrated passives, measuring their properties, and applying them to microelectronic systems.

In order to bring professionals up to date in this fast-moving technology and enable them to implement it into their own manufacturing environments, the editors address some basic questions concerning the tradeoffs between discrete and integrated approaches, including:

• What are the advantages and disadvantages of integrated passives?
• Is this processing compatible with existing substrates?
• Can integrated passives be made with conventional PWB fabrication equipment?
• How do the electrical characteristics of integrated passives differ from discretes?
• How are integrated passives designed?
• What must be considered in the economic analysis?

Integrated Passive Component Technology is the first book dedicated to this subject. A comprehensive survey of the state of the art, it will be an invaluable resource for engineers and materials scientists in the microelectronics industry. Interdisciplinary issues are presented in clearly delineated sections throughout the book so readers can pick those parts that are most beneficial to them.

For the past seventy years, ferrites (magnetic ceramics) have been prized for a range of properties that has no equivalent in the existing metal magnetic materials. They have contributed to many important advances in electronics and new high-performance products are appearing all the time. Ferrite technology has produced greater progress in the past 15 years since the first edition was published. Many of the semiconductor and IC technology responsible for the computer and Internet explosion would not have been possible without the magnetic materials technology needed for powering and otherwise exploiting those developments.

Modern Ferrite Technology, 2nd ed, offers the readers an expert overview of the latest ferrite advances as well as their applications in electronic components. This volume develops the interplay among material properties, component specification and device requirements using ferrites. Throughout, emphasis is placed on practical technological concerns as opposed to mathematical and physical aspects of the subject.

The book traces the origin of the magnetic effect in ferrites from the level of the simplest particle and the increases the scope to the larger and larger hierarchies. From the desired magnetic properties the author deduces the physical and chemical material parameters, taking into consideration major chemistry, impurity levels, ceramic microstructures and grain boundary effects. He then discusses the processing conditions and associated conditions required for implementation. In addition to conventional ceramic techniques, he describes non-conventional methods such as coprecipitation, co-spray roasting and single crystal growth.

The secondsection of this book deals with a complete listing of the many important applications in the field including ferrites for permanent magnet, telecommunications, power supplies, memory systems magnetic recording and microwave applications.

The function of ferrites in each of these applications is described. The requirements of the electronic circuit and device are broken down into the individual component specifications with regard to size and configuration. Design criteria for power level, degree of stability and cost are then considered.

This reference presents a system analysis of the fibre-optic gyro. Drawing on 15 years of research and developments, it describes the concepts that have emerged as the preferred solutions for obtaining a practical device, and provides access to the information needed to know about optics, single-mode fibre optics and integrated optics to understand the fibre gyro.

A hands-on guide to finding the sources of electromagnetic interference and then fixing the problems. Includes basic theory of EMI as well as detailed explanations of why this problem is becoming more serious as the international scope of the communications and electronics industries grow. This book is not a textbook, but rather a handbook that will become a constant source of reference for anyone who runs into trouble with EMI. Includes chapters on grounding, circuit shielding and filtering, preventing EMI in circuit design, as well as EMI sources such as power lines, transmitters, television, consumer electronics, telephones, automobiles, and the ever-frustrating mystery EMI.

There are very few other books available even though EMI is constantly discussed and cursed. Most of the books on the market are about how to prevent EMI in circuit design or approaches to understanding the theory behind EMI. Though this information is important, especially to an engineering audience, these books hold no value at all to the technicians and hands-on practitioners in the fields of communications and servicing.These savvy professionals know that the book they are looking for and need is just not on the market. To get the information they need, this group is forced to read every magazine article they can find on the subject and rely on the advice of other professionals whether through technician groups or newsgroups. This book fills a void in the telecommunications and electronics industries by providing practical troubleshooting information.

Addresses the technician's needs and interests
Written by an eminent authority in the field
Covers correction and prevention of problems with EMI

Laser Diode Microsystems provides the reader with the basic knowledge and understanding required for using semiconductor laser diodes in optical microsystems and micro-optical electromechanic systems. This tutorial addresses the fundamentals of semiconductor laser operation and design, coupled with an overview of the types of laser diodes suitable for use in Microsystems, along with their distinguishing characteristics. Emphasis is placed on laser diode characterization and measurement as well as the assembly techniques and optical accessories required for incorporation of semiconductor lasers into complex microsystems. Equipped with typical results and calculation examples, this hand-on text helps readers to develop a feel for how to choose a laser diode, characterize it and incorporate it into a microsystem.

"System level testing is becoming increasingly important. It is driven by the incessant march of complexity ... which is forcing us to renew our thinking on the processes and procedures that we apply to test and diagnosis of systems. In fact, the complexity defines the system itself which, for our purposes, is Aany aggregation of related elements that together form an entity of sufficient complexity for which it is impractical to treat all of the elements at the lowest level of detail . System approaches embody the partitioning of problems into smaller inter-related subsystems that will be solved together. Thus, words like hierarchical, dependence, inference, model, and partitioning are frequent throughout this text. Each of the authors deals with the complexity issue in a similar fashion, but the real value in a collected work such as this is in the subtle differences that may lead to synthesized approaches that allow even more progress. The works included in this volume are an outgrowth of the 2nd International Workshop on System Test and Diagnosis held in Alexandria, Virginia in April 1998. The first such workshop was held in Freiburg, Germany, six years earlier. In the current workshop nearly 50 experts from around the world struggled over issues concerning the subject... In this volume, a select group of workshop participants was invited to provide a chapter that expanded their workshop presentations and incorporated their workshop interactions... While we have attempted to present the work as one volume and requested some revision to the work, the content of the individual chapters was not edited significantly. Consequently, you will see different approaches to solving the sameproblems and occasional disagreement between authors as to definitions or the importance of factors. ... The works collected in this volume represent the state-of-the-art in system test and diagnosis, and the authors are at the leading edge of that science...." From the Preface

In modern electoral processes, Information and Communication Technologies play a crucial role, whether used in voter registration, ballot casting, or processing of results. Securing these systems is a necessary step in ensuring the fairness of the democratic process. Design, Development, and Use of Secure Electronic Voting Systems analyzes current research on the integration of modern technologies with traditional democratic systems, providing a framework for designing and deploying electronic voting systems in any context or society. Stakeholders, researchers, architects, designers, and scholars interested in the use of electronic systems in government processes will use this book to gain a broader understanding of some of the latest advances in this emerging field.

This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits. The authors discuss several key challenges in post-silicon validation and provide automated solutions that are systematic and cost-effective. A series of automatic tracing solutions and innovative design for debug (DfD) techniques are described, including techniques for trace signal selection for enhancing visibility of functional errors, a multiplexed signal tracing strategy for improving functional error detection, a tracing solution for debugging electrical errors, an interconnection fabric for increasing data bandwidth and supporting multi-core debug, an interconnection fabric design and optimization technique to increase transfer flexibility and a DfD design and associated tracing solution for improving debug efficiency and expanding tracing window. The solutions presented in this book improve the validation quality of VLSI circuits, and ultimately enable the design and fabrication of reliable electronic devices.