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Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Electronic devices & materials > General
The great interest in photonic crystals and their applications in the last 15 years is being expressed in the publishing of a large number of monographs, collections, textbooks and tutorials, where existing knowledge concerning - eration principles of photonic crystal devices and microstructured ?bers, their mathematicaldescription,well-knownandnovelapplicationsofsuchtechno- gies in photonics and optical communications are presented. They challenges authors of new books to cover the gaps still existing in the literature and highlight and popularize of already known material in a new and original manner. Authorsofthisbookbelievethatthenextsteptowardswideapplicationof photoniccrystalsisthesolutionofmanypracticalproblemsofdesignandc- putation of the speci?c photonic crystal-based devices aimed at the speci?c technicalapplication.Inordertomakethisstep,itisnecessarytoincreasethe number of practitioners who can solve such problems independently. The aim of this book is to extend the group of researchers, developers and students, who could practically use the knowledge on the physics of photonic crystals together with the knowledge and skills of independent calculation of basic characteristics of photonic crystals and modeling of various elements of - tegrated circuits and optical communication systems created on the basis of photonic crystals. The book is intended for quali?ed readers, specialists in the ?eld of optics and photonics, students of higher courses, master degree students and PhD students. As an introduction to the snopest, the book contains the basics of wave optics and radiation propagation in simple guiding media such as planar waveguides and step-index ?bers.
Branch-and-bound search has been known for a long time and has been widely used in solving a variety of problems in computer-aided design (CAD) and many important optimization problems. In many applications, the classic branch-and-bound search methods perform duplications of computations, or rely on the search decision trees which keep track of the branch-and-bound search processes. In CAD and many other technical fields, the computational cost of constructing branch-and-bound search decision trees in solving large scale problems is prohibitive and duplications of computations are intolerable. Efficient branch-and-bound methods are needed to deal with today's computational challenges. Efficient branch-and-bound methods must not duplicate computations. Efficient Branch and Bound Search with Application to Computer-Aided Design describes an efficient branch-and-bound method for logic justification, which is fundamental to automatic test pattern generation (ATPG), redundancy identification, logic synthesis, minimization, verification, and other problems in CAD. The method is called justification equivalence, based on the observation that justification processes may share identical subsequent search decision sequences. With justification equivalence, duplication of computations is avoided in the dynamic branch-and-bound search process without using search decision trees. Efficient Branch and Bound Search with Application to Computer-Aided Design consists of two parts. The first part, containing the first three chapters, provides the theoretical work. The second part deals with applications, particularly ATPG for sequential circuits. This book is particularly useful to readers who are interested in the design and test of digital circuits.
System Test and Diagnosis is the first book on test and diagnosis at the system level, defined as any aggregation of related elements that together form an entity of sufficient complexity for which it is impractical to treat all of the elements at the lowest level of detail. The ideas presented emphasize that it is possible to diagnose complex systems efficiently. Since the notion of system is hierarchical, these ideas are applicable to all levels. The philosophy is presented in the context of a model-based approach, using the information flow model, that focuses on the information provided by the tests rather than the functions embedded in the system. Detailed algorithms are offered for evaluating system testability, performing efficient diagnosis, verifying and validating the models, and constructing an architecture for system maintenance. Several advanced algorithms, not commonly available in existing diagnosis tools, are discussed, including reasoning with inexact or uncertain test data, breaking large problems into manageable smaller problems, diagnosing systems with time sensitive information and time dependent tests and learning from experience. The book is divided into three parts. The first part provides motivation for careful development of the subject and the second part provides the tools necessary for analyzing system testability and computing diagnostic strategies. The third part presents advanced topics in diagnosis. Several case studies are provided, including a single detailed case study. Smaller case studies describe experiences from actual applications of the methods discussed. The detailed case study walks the reader through a complete analysis of a system to illustrate the concepts and describe the analyses that are possible. All case studies are based upon real systems that have been modeled for the purposes of diagnosis. System Test and Diagnosis is the culmination of nearly twelve years of research into diagnosis modeling and its applications. It is designed as a primary reference for engineers and practitioners interested in system test and diagnosis.
For courses in basic electronics and electronic devices and circuits Electronic Devices, 10th Edition, provides a solid foundation in basic analog electronics and a thorough introduction to analog integrated circuits and programmable devices. The text identifies the circuits and components within a system, helping students see how the circuit relates to the overall system function. Full-colour photos and illustrations and easy-to-follow worked examples support the text's strong emphasis on real-world application and troubleshooting. Updated throughout, the 10th Edition features selected circuits keyed to Multisim V14 and LT Spice files so that students learn how to simulate, analyse, and troubleshoot using the latest circuit simulation software.
This book discusses the effects, modeling, latest results, and nanotechnology applications of rainbows that appear during channeling of charged particles in crystals and nanotubes. The authors begin with a brief review of the optical and particle rainbow effects followed by a detailed description of crystal rainbows, which appear in ion channeling in crystals, and their modeling using catastrophe theory. The effects of spatial and angular focusing of channeled ions are described, with special attention given to the applications of the former effect to subatomic microscopy. The results of a thorough study of the recent high-resolution channeling experiments performed with protons of energies between 2.0 and 0.7 MeV and a 55 nm thick silicon crystal are also provided. This study opens up the potential for accurate analysis of very thin crystals. Also presented are recent results related to rainbows occurring in proton transmission through carbon nanotubes, and a detailed quantum consideration of the transmission of positrons of an energy of 1 MeV through very short carbon nanotubes. This process is determined by the rainbow effect. The initial positron beam is represented as an ensemble of non-interacting Gaussian wave packets, and the principal and supernumerary primary rainbows appearing in the spatial and angular distributions of transmitted positrons are clearly identified. They are explained by the effects of wrinkling, concentration and coordination of the wave packets.
An important real-world look at the status and future of integrated passives This book provides an overview of the technology, potential applications, motivations, and problems associated with integrating resistors, capacitors, and inductors into circuit boards instead of mounting them as discrete components on the surface. Written primarily for engineers and scientists in industry who want to determine if passive integration is a viable option for a particular product, the text describes the processes available for designing and fabricating integrated passives, measuring their properties, and applying them to microelectronic systems. In order to bring professionals up to date in this fast-moving technology and enable them to implement it into their own manufacturing environments, the editors address some basic questions concerning the tradeoffs between discrete and integrated approaches, including:
Integrated Passive Component Technology is the first book dedicated to this subject. A comprehensive survey of the state of the art, it will be an invaluable resource for engineers and materials scientists in the microelectronics industry. Interdisciplinary issues are presented in clearly delineated sections throughout the book so readers can pick those parts that are most beneficial to them.
Gallium Arsenide technology has come of age. GaAs integrated circuits are available today as gate arrays with an operating speed in excess of one Gigabits per second. Special purpose GaAs circuits are used in optical fiber digital communications systems for the purpose of regeneration, multiplexing and switching of the optical signals. As advances in fabrication and packaging techniques are made, the operat ing speed will further increase and the cost of production will reach a point where large scale application of GaAs circuits will be economical in these and other systems where speed is paramount. This book is written for students and engineers who wish to enter into this new field of electronics for the first time and who wish to embark on a serious study of the subject of GaAs circuit design. No prior knowledge of GaAs technology is assumed though some previous experience with MOS circuit design will be helpful. A good part of the book is devoted to circuit analysis, to the extent that is possible for non linear circuits. The circuit model of the GaAs transistor is derived from first principles and analytic formulas useful in predicting the approxi mate circuit performance are also derived. Computer simulation is used throughout the book to show the expected performance and to study the effects of parameter variations."
This proven textbook guides readers to a thorough understanding of the theory and design of operational amplifiers (OpAmps). The core of the book presents systematically the design of operational amplifiers, classifying them into a periodic system of nine main overall configurations, ranging from one gain stage up to four or more stages. This division enables circuit designers to recognize quickly, understand, and choose optimal configurations. Characterization of operational amplifiers is given by macro models and error matrices, together with measurement techniques for their parameters. Definitions are given for four types of operational amplifiers depending on the grounding of their input and output ports. Many famous designs are evaluated in depth, using a carefully structured approach enhanced by numerous figures. In order to reinforce the concepts introduced and facilitate self-evaluation of design skills, the author includes problems with detailed solutions, as well as simulation exercises.
Describes the optical structure and optical properties of the human eye Explains image formation and refraction of the eye Covers interactions between light and the eye, considering transmission, reflection and scatter in the media of the eye and at the fundus Covers aberrations and image quality of the eye
For the past seventy years, ferrites (magnetic ceramics) have been prized for a range of properties that has no equivalent in the existing metal magnetic materials. They have contributed to many important advances in electronics and new high-performance products are appearing all the time. Ferrite technology has produced greater progress in the past 15 years since the first edition was published. Many of the semiconductor and IC technology responsible for the computer and Internet explosion would not have been possible without the magnetic materials technology needed for powering and otherwise exploiting those developments. Modern Ferrite Technology, 2nd ed, offers the readers an expert overview of the latest ferrite advances as well as their applications in electronic components. This volume develops the interplay among material properties, component specification and device requirements using ferrites. Throughout, emphasis is placed on practical technological concerns as opposed to mathematical and physical aspects of the subject. The book traces the origin of the magnetic effect in ferrites from the level of the simplest particle and the increases the scope to the larger and larger hierarchies. From the desired magnetic properties the author deduces the physical and chemical material parameters, taking into consideration major chemistry, impurity levels, ceramic microstructures and grain boundary effects. He then discusses the processing conditions and associated conditions required for implementation. In addition to conventional ceramic techniques, he describes non-conventional methods such as coprecipitation, co-spray roasting and single crystal growth. The secondsection of this book deals with a complete listing of the many important applications in the field including ferrites for permanent magnet, telecommunications, power supplies, memory systems magnetic recording and microwave applications. The function of ferrites in each of these applications is described. The requirements of the electronic circuit and device are broken down into the individual component specifications with regard to size and configuration. Design criteria for power level, degree of stability and cost are then considered.
Silicon technology has developed along virtually one single line: reducing the minimal size of lithographic features. But has this taken us to the point of diminishing returns? Are we now at a turning point in the logical evolution of microelectronics? Some believe that the semiconductor microelectronics industry has matured: the research game is over (comparisons with the steel industry are being made). Others believe that qualitative progress in hardware technology will come roaring back, based on innovative research. This debate, spirited as it is, is reflected in the pages of Future Trends in Microelectronics, where such questions are discussed. What kind of research does the silicon industry need to continue its expansion? What is the technical limit to shrinking Si devices? Is there any economic sense in pursuing this limit? What are the most attractive applications of optoelectronic hybrid systems? Are there any green pastures beyond the traditional semiconductor technologies? Identifying the scenario for the future evolution of microelectronics will present a tremendous opportunity for constructive action today.
In modern electoral processes, Information and Communication Technologies play a crucial role, whether used in voter registration, ballot casting, or processing of results. Securing these systems is a necessary step in ensuring the fairness of the democratic process. Design, Development, and Use of Secure Electronic Voting Systems analyzes current research on the integration of modern technologies with traditional democratic systems, providing a framework for designing and deploying electronic voting systems in any context or society. Stakeholders, researchers, architects, designers, and scholars interested in the use of electronic systems in government processes will use this book to gain a broader understanding of some of the latest advances in this emerging field.
Metamaterials are artificially designed materials engineered to acquire their properties by their specific structure rather than their composition. They are considered a major scientific breakthrough and have attracted enormous attention over the past decade. The major challenge in obtaining an optical metamaterial active at visible frequencies is the fabrication of complex continuous metallic structures with nano metric features. This thesis presents the fabrication and characterization of optical metamaterials made by block copolymer self assembly. This approach allows fabrication of an intriguing and complex continuous 3D architecture called a gyroid, which is replicated into active plasmonic materials such as gold. The optical properties endowed by this particular gyroid geometry include reduction of plasma frequency, extraordinarily enhanced optical transmission, and a predicted negative refractive index. To date, this is the 3D optical metamaterial with the smallest features ever made.
Laser Diode Microsystems provides the reader with the basic knowledge and understanding required for using semiconductor laser diodes in optical microsystems and micro-optical electromechanic systems. This tutorial addresses the fundamentals of semiconductor laser operation and design, coupled with an overview of the types of laser diodes suitable for use in Microsystems, along with their distinguishing characteristics. Emphasis is placed on laser diode characterization and measurement as well as the assembly techniques and optical accessories required for incorporation of semiconductor lasers into complex microsystems. Equipped with typical results and calculation examples, this hand-on text helps readers to develop a feel for how to choose a laser diode, characterize it and incorporate it into a microsystem.
"System level testing is becoming increasingly important. It is driven by the incessant march of complexity ... which is forcing us to renew our thinking on the processes and procedures that we apply to test and diagnosis of systems. In fact, the complexity defines the system itself which, for our purposes, is Aany aggregation of related elements that together form an entity of sufficient complexity for which it is impractical to treat all of the elements at the lowest level of detail . System approaches embody the partitioning of problems into smaller inter-related subsystems that will be solved together. Thus, words like hierarchical, dependence, inference, model, and partitioning are frequent throughout this text. Each of the authors deals with the complexity issue in a similar fashion, but the real value in a collected work such as this is in the subtle differences that may lead to synthesized approaches that allow even more progress. The works included in this volume are an outgrowth of the 2nd International Workshop on System Test and Diagnosis held in Alexandria, Virginia in April 1998. The first such workshop was held in Freiburg, Germany, six years earlier. In the current workshop nearly 50 experts from around the world struggled over issues concerning the subject... In this volume, a select group of workshop participants was invited to provide a chapter that expanded their workshop presentations and incorporated their workshop interactions... While we have attempted to present the work as one volume and requested some revision to the work, the content of the individual chapters was not edited significantly. Consequently, you will see different approaches to solving the sameproblems and occasional disagreement between authors as to definitions or the importance of factors. ... The works collected in this volume represent the state-of-the-art in system test and diagnosis, and the authors are at the leading edge of that science...." From the Preface
This book focuses on the essential scientific ideas and breakthroughs in the last three decades for organic solar cells that have realized practical applications. The motivation for publishing this book is to explain how those essential ideas have arisen and to provide a foundation for future progress by target readers-students, novices in the field, and scientists with expertise. The main topics covered in the book include the fundamental principles and history of organic solar cells, blended junction, nanostructure control, photocurrent generation, photovoltage generation, doping, practical organic solar cells, and possible ideas for the future. The editors enthusiastically anticipate the vigorous development of the field of organic solar cells by young scientists of the next generation.
Summarizes current recycling processes, challenges, and perspectives. Offers a comprehensive review of current commercialized LIB recycling companies. Showcases an innovative closed-loop hydrometallurgical recycling process to recycle lithium cathode materials. Provides detailed modelling and economic analysis of several hydrometallurgical recycling processes. Features practical cases and data developed by the authors.
This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits. The authors discuss several key challenges in post-silicon validation and provide automated solutions that are systematic and cost-effective. A series of automatic tracing solutions and innovative design for debug (DfD) techniques are described, including techniques for trace signal selection for enhancing visibility of functional errors, a multiplexed signal tracing strategy for improving functional error detection, a tracing solution for debugging electrical errors, an interconnection fabric for increasing data bandwidth and supporting multi-core debug, an interconnection fabric design and optimization technique to increase transfer flexibility and a DfD design and associated tracing solution for improving debug efficiency and expanding tracing window. The solutions presented in this book improve the validation quality of VLSI circuits, and ultimately enable the design and fabrication of reliable electronic devices.
examples are presented. These chapters are intended to introduce the reader to the programs. The program structure and models used will be described only briefly. Since these programs are in the public domain (with the exception of the parasitic simulation programs), the reader is referred to the manuals for more details. In this second edition, the process program SUPREM III has been added to Chapter 2. The device simulation program PISCES has replaced the program SIFCOD in Chapter 3. A three-dimensional parasitics simulator FCAP3 has been added to Chapter 4. It is clear that these programs or other programs with similar capabilities will be indispensible for VLSI/ULSI device developments. Part B of the book presents case studies, where the application of simu lation tools to solve VLSI device design problems is described in detail. The physics of the problems are illustrated with the aid of numerical simulations. Solutions to these problems are presented. Issues in state-of-the-art device development such as drain-induced barrier lowering, trench isolation, hot elec tron effects, device scaling and interconnect parasitics are discussed. In this second edition, two new chapters are added. Chapter 6 presents the methodol ogy and significance of benchmarking simulation programs, in this case the SUPREM III program. Chapter 13 describes a systematic approach to investi gate the sensitivity of device characteristics to process variations, as well as the trade-otIs between different device designs."
Physics of Thin Films is one of the longest running continuing
series in thin film science, consisting of 25 volumes since 1963.
The series contains quality studies of the properties of various
thin films materials and systems. In order to be able to reflect
the development of today's science and to cover all modern aspects
of thin films, the series, starting with Volume 20, has moved
beyond the basic physics of thin films. It now addresses the most
important aspects of both inorganic and organic thin films, in both
their theoretical and their technological aspects.
Particle simulation of semiconductor devices is a rather new field which has started to catch the interest of the world's scientific community. It represents a time-continuous solution of Boltzmann's transport equation, or its quantum mechanical equivalent, and the field equation, without encountering the usual numerical problems associated with the direct solution. The technique is based on first physical principles by following in detail the transport histories of indi vidual particles and gives a profound insight into the physics of semiconductor devices. The method can be applied to devices of any geometrical complexity and material composition. It yields an accurate description of the device, which is not limited by the assumptions made behind the alternative drift diffusion and hydrodynamic models, which represent approximate solutions to the transport equation. While the development of the particle modelling technique has been hampered in the past by the cost of computer time, today this should not be held against using a method which gives a profound physical insight into individual devices and can be used to predict the properties of devices not yet manufactured. Employed in this way it can save the developer much time and large sums of money, both important considerations for the laboratory which wants to keep abreast of the field of device research. Applying it to al ready existing electronic components may lead to novel ideas for their improvement. The Monte Carlo particle simulation technique is applicable to microelectronic components of any arbitrary shape and complexity.
Transparent conducting materials are key elements in a wide variety of current technologies including flat panel displays, photovoltaics, organic, low-e windows and electrochromics. The needs for new and improved materials is pressing, because the existing materials do not have the performance levels to meet the ever- increasing demand, and because some of the current materials used may not be viable in the future. In addition, the field of transparent conductors has gone through dramatic changes in the last 5-7 years with new materials being identified, new applications and new people in the field. "Handbook of Transparent Conductors" presents transparent conductors in a historical perspective, provides current applications as well as insights into the future of the devices. It is a comprehensive reference, and represents the most current resource on the subject.
Monte Carlo simulation is now a well established method for studying semiconductor devices and is particularly well suited to highlighting physical mechanisms and exploring material properties. Not surprisingly, the more completely the material properties are built into the simulation, up to and including the use of a full band structure, the more powerful is the method. Indeed, it is now becoming increasingly clear that phenomena such as reliabil ity related hot-electron effects in MOSFETs cannot be understood satisfac torily without using full band Monte Carlo. The IBM simulator DAMOCLES, therefore, represents a landmark of great significance. DAMOCLES sums up the total of Monte Carlo device modeling experience of the past, and reaches with its capabilities and opportunities into the distant future. This book, therefore, begins with a description of the IBM simulator. The second chapter gives an advanced introduction to the physical basis for Monte Carlo simulations and an outlook on why complex effects such as collisional broadening and intracollisional field effects can be important and how they can be included in the simulations. References to more basic intro the book. The third chapter ductory material can be found throughout describes a typical relationship of Monte Carlo simulations to experimental data and indicates a major difficulty, the vast number of deformation poten tials required to simulate transport throughout the entire Brillouin zone. The fourth chapter addresses possible further extensions of the Monte Carlo approach and subtleties of the electron-electron interaction."
The ELFNET Book on Failure Mechanisms, Testing Methods, and Quality Issues of Lead-Free Solder Interconnects is the work of the European network ELFNET which was founded by the European Commission in the 6th Framework Programme. It brings together contributions from the leading European experts in lead-free soldering. The limited validity of testing methods originating from tin-lead solder was a major point of concern in ELFNET members' discussions. As a result, the network's reliability group decided to bring together the material properties of lead-free solders, as well as the basics of material science, and to discuss their influence on the procedures for accelerated testing. This has led to a matrix of failure mechanisms and their activation and, as a result, to a comprehensive coverage of the scientific background and its applications in reliability testing of lead-free solder joints. The ELFNET Book on Failure Mechanisms, Testing Methods, and Quality Issues of Lead-Free Solder Interconnects is written for scientists, engineers and researchers involved with lead-free electronics. |
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