|
Books > Science & Mathematics > Science: general issues > Scientific standards
|
Buy Now
Kelvin Probe Force Microscopy - From Single Charge Detection to Device Characterization (Paperback, Softcover reprint of the original 1st ed. 2018)
Loot Price: R6,721
Discovery Miles 67 210
|
|
|
Kelvin Probe Force Microscopy - From Single Charge Detection to Device Characterization (Paperback, Softcover reprint of the original 1st ed. 2018)
Series: Springer Series in Surface Sciences, 65
Expected to ship within 10 - 15 working days
|
This book provides a comprehensive introduction to the methods and
variety of Kelvin probe force microscopy, including technical
details. It also offers an overview of the recent developments and
numerous applications, ranging from semiconductor materials,
nanostructures and devices to sub-molecular and atomic scale
electrostatics. In the last 25 years, Kelvin probe force microscopy
has developed from a specialized technique applied by a few
scanning probe microscopy experts into a tool used by numerous
research and development groups around the globe. This sequel to
the editors' previous volume "Kelvin Probe Force Microscopy:
Measuring and Compensating Electrostatic Forces," presents new and
complementary topics. It is intended for a broad readership, from
undergraduate students to lab technicians and scanning probe
microscopy experts who are new to the field.
General
Is the information for this product incomplete, wrong or inappropriate?
Let us know about it.
Does this product have an incorrect or missing image?
Send us a new image.
Is this product missing categories?
Add more categories.
Review This Product
No reviews yet - be the first to create one!
|
You might also like..
|
Email address subscribed successfully.
A activation email has been sent to you.
Please click the link in that email to activate your subscription.
Welcome to Loot.co.za!
Sign in / Register |Wishlists & Gift Vouchers |Help | Advanced search
